Untitled
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BD9160FVM RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BD9160FVM
10cycles
30min)
100cycles
1000hours
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Untitled
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU99901GUZ RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU99901GUZ
10cycles
30min)
100cycles
1000hours
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Untitled
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU9833GUL RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU9833GUL
10cycles
30min)
100cycles
1000hours
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Untitled
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU9829GUL RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU9829GUL
10cycles
30min)
100cycles
1000hours
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bu9844
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU9844GUL RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU9844GUL
10cycles
30min)
100cycles
1000hours
bu9844
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Untitled
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU9889GUL RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU9889GUL
10cycles
30min)
100cycles
1000hours
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BU9880GUL
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU9880GUL RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU9880GUL
10cycles
30min)
100cycles
1000hours
BU9880GUL
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Untitled
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BR25S128GUZ RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BR25S128GUZ
10cycles
30min)
100cycles
1000hours
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Untitled
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU9847GUL RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU9847GUL
10cycles
30min)
100cycles
1000hours
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Untitled
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU9832GUL RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU9832GUL
10cycles
30min)
100cycles
1000hours
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BU9890GUL
Abstract: No abstract text available
Text: Reliability Test Result DEVICE : BU9890GUL RESULT n pn pcs (pcs) － 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage
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BU9890GUL
10cycles
30min)
100cycles
1000hours
BU9890GUL
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Untitled
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C Series TMP86FH93NG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity
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TLCS-870/C
TMP86FH93NG
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hf 224 capacitor
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C Series TMP86C407MG TMP86C407MG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and
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TLCS-870/C
TMP86C407MG
hf 224 capacitor
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hf 224 capacitor
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C Series TMP86C808DMG TMP86C808DMG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and
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TLCS-870/C
TMP86C808DMG
hf 224 capacitor
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TMP86CM74AFG
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C Series TMP86CM74AFG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and
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TLCS-870/C
TMP86CM74AFG
TMP86CM74AFG
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Untitled
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FH46 The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and
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TLCS-870/C1
TMP89FH46
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automatic light dimmer based on temperature
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C Series TMP86CK74AFG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and
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TLCS-870/C
TMP86CK74AFG
automatic light dimmer based on temperature
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Untitled
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FM46L The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity
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TLCS-870/C1
TMP89FM46L
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Untitled
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89CM42 The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity
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TLCS-870/C1
TMP89CM42
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tmp86fs49aug
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C Series TMP86FS49AUG TMP86FS49AUG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and
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TLCS-870/C
TMP86FS49AUG
tmp86fs49aug
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Untitled
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C Series TMP86FH47ADUG TMP86FH47ADUG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and
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TLCS-870/C
TMP86FH47ADUG
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Untitled
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FH42L The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity
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TLCS-870/C1
TMP89FH42L
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Untitled
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FM42L 2009 TOSHIBA CORPORATION All Rights Reserved Revision History Date Revision 2008/2/14 1 First Release 2008/9/3 2 Contents Revised 2009/7/21 3 Contents Revised Table of Contents TMP89FM42L 1.1 1.2 1.3 1.4
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TLCS-870/C1
TMP89FM42L
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w1p84
Abstract: No abstract text available
Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FM82 2009 TOSHIBA CORPORATION All Rights Reserved TMP89FM82 Considerations for using Motor Control Circuit PMD:Programmable Motor Driver Following considerations are necessary for writing data to electrical lead angle timer (ELDEG) and reading 2 bytes
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TLCS-870/C1
TMP89FM82
0x017F
0x0000
w1p84
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