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    p-iris control

    Abstract: No abstract text available
    Text: Am27S65 Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability DISTINCTIVE CHARACTERISTICS On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or


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    PDF Am27S65 4096-Bit 24-pin, 300-mil BD005830 27S65A 27S65 p-iris control

    29MA16

    Abstract: am27s47a AM27S45a AM27S45s Am27S85 Am27LS291 AM27S85A CD3024 PD3024
    Text: A m P A L * H C 2 9 M A 16 /A m P A L H C T 2 9 M A 16 24-Pin E2-Based CMOS Programmable Array Logic ADVANCE INFORMATION • • • • H igh-perform ance sem i-custom logic replacem ent; E lectrically Erasable E2 technology allows repro­ gram mability


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    PDF HC29MA16/AmPALHCT29MA16 24-Pin standa75mA Am27S75A 25ns/12ns/175mA Am27S291 35ns/185mA Am27LS291 30ns/90mA Am27S291SA 29MA16 am27s47a AM27S45a AM27S45s Am27S85 AM27S85A CD3024 PD3024

    27S55A

    Abstract: No abstract text available
    Text: AmPAL* HC29MA16/AmPALHCT29MA16 24-Pin E2-Based C M O S Programmable Array Logic A D VA N C E INFORMATION • Register/Latch PR E L O A D permits full logical verifica­ tion • Available in high-speed tpo “ 35 ns, fMAX = 20 MHz and standard-speed (tpo ” 45 ns, fMAX “ 15.0 MHz)


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    PDF HC29MA16/AmPALHCT29MA16 24-Pin 300-mil 28-pin PAL29MA16 7S45A 40ns/20ns/185mA 27S45SA 25ns/10ns/185mA 27S55A

    Untitled

    Abstract: No abstract text available
    Text: Am 27S65 Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability DISTINCTIVE CHARACTERISTICS • • • • On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or


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    PDF Am27S65 4096-Bit 1024x4) 24-pin, 300-mil BD005830 27S65A 27S65 27S65

    Untitled

    Abstract: No abstract text available
    Text: Am 27S65 Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability DISTINCTIVE CHARACTERISTICS • • • • On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or


    OCR Scan
    PDF Am27S65 4096-Bit 1024x4) 24-pin, 300-mil BD005830 27S65A 27S65

    Untitled

    Abstract: No abstract text available
    Text: Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability DISTINCTIVE CHARACTERISTICS • • • • On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or


    OCR Scan
    PDF Am27S65 4096-Bit 24-pin, 300-mil BD005830 27S65A 27SS5 27S65 CD000541

    af0001

    Abstract: No abstract text available
    Text: Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability • • • • On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or


    OCR Scan
    PDF Am27S65 4096-Bit 24-pin, 300-mil MIL-STD-883, af0001