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    28C64 EEPROM

    Abstract: eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C64 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -DATA RETENTION BAKE (200°C) -CYCLE TEST -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY LIFE TEST


    Original
    PDF AT-28C64 AT-28C64 187-3B 133317B2 232510B-2 3A0781 3A0782B1 4B1973 4D1971 4D1971-2 28C64 EEPROM eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616

    28HC64

    Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
    Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.


    Original
    PDF AT-28HC64 MIL-M-38535 AT-28HC191/291 AT-28PC64 AT-28C256 AT-28HC16/17 AT-28HC64 033474C 234583C1 28HC64 28PC64 28HC16 9C8944 Activation Energy