ic 74138
Abstract: IC 7402, 7404, 7408, 7432, 7400 ic 74139 IC 74147 IC 74373 74148 IC IC 74374 ic 7408, 7432, 7404, 7400, 7433, 7486, 74266 IC 74245 74189
Text: LEAPER-1 HANDY DIGITAL IC TESTER Supported Devices Features EMC Standards 1.Easy-operating Tester, particularly per 89/336/EEC be designed for the Digital IC 2.Supported Device : 74 / 40 / 45 / 41 / 44 Serial. 3.Small, portable, light and powersaving, usable with batteries.
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89/336/EEC
34kgs
5000m
EN50081-1
EN50082-1
EN55022
IEC801-2
EN60555-210
40H78
ic 74138
IC 7402, 7404, 7408, 7432, 7400
ic 74139
IC 74147
IC 74373
74148 IC
IC 74374
ic 7408, 7432, 7404, 7400, 7433, 7486, 74266
IC 74245
74189
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PDF
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Digital IC tester
Abstract: MC140 Datasheet IC 244, 245, 373, 374 ic 8255 z80 8255 MC140 LIST OF 74 IC SERIES 8253/8254 IC 2816 IC 8155
Text: IC Testers VPL-DICT Digital IC Tester VPL-DICT is aHand-Held version, designed as a powerful tool for manufacturers, servicing engineers, R&D personnels to test a wide range of Digital IC's. FEATURES l Tests most of the 6 to 40 pin ICs in DIP package. The list
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8088/8085/Z80/6502)
MC140)
MC140
MC145
Delhi-110092.
Digital IC tester
MC140 Datasheet
IC 244, 245, 373, 374
ic 8255
z80 8255
MC140
LIST OF 74 IC SERIES
8253/8254
IC 2816
IC 8155
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PDF
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TCXO KSS 12,8 mhz
Abstract: KSS tcxo 12.8MHz TCXO KSS 1bw12 TA31183BFN
Text: TO SH IBA TA31183BFN TOSHIBA BIPOLAR LINEAR INTEGRATED CIRCUIT SILICON MONOLITHIC T AB 1 1 8 3 B F N IF Digital Mobile Radio IC with Built-in Filter This intermediate frequency IF IC with built-in channel selection filter is designed for use in digital mobile radio
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OCR Scan
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TA31183BFN
31183BFN
20-pin
TCXO KSS 12,8 mhz
KSS tcxo 12.8MHz
TCXO KSS
1bw12
TA31183BFN
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PDF
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575A digital ic tester
Abstract: MC3400
Text: Data Sheet Handheld IC Testers Models 570A and 575A Model 570A analog and model 575A digital IC testers are compact, handheld, battery powered testers offering advanced functionality and ease of use. The 2-line x 16 character dot matrix LCD shows the result
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ULN2000
DS8800
MC6800
MC3400
MC6500
v09102012
575A digital ic tester
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PDF
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IC-3426
Abstract: MIXER MARK 210 HP8447F RSSI mixer 455 IC-8949
Text: DATA SHEET BIPOLAR ANALOG INTEGRATED CIRCUIT µPC8001 IF AMPLIFIER IC WITH ON-CHIP MIXER FOR DIGITAL CELLULAR PHONES The µPC8001 is a 3-volt IF amplifier IC with an on-chip mixer developed for digital cellular phones. The µPC8001 consists of a high-sensitivity limiter amplifier with an input frequency of 455 kHz, a high-speed
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PC8001
PC8001
14-pin
IC-3426
MIXER MARK 210
HP8447F
RSSI mixer 455
IC-8949
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PDF
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32-PIN
Abstract: DS2172 PS24 PS26 PS27 PS28 PS29 PS30 335 PR10
Text: DS2172 1 DALLAS s e m ic o n d u c t o r DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT FEATURES • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communica tions systems r • Operates at speeds from DC to 52 MHz
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OCR Scan
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DS2172
32-bit
2hl413D
32-PIN
DS2172
PS24
PS26
PS27
PS28
PS29
PS30
335 PR10
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PDF
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Untitled
Abstract: No abstract text available
Text: DALLAS s e m ic o n d u c t o r DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT FEATURES • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communica tions systems “û h ( 32 • Operates at speeds from DC to 52 MHz
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OCR Scan
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PDF
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Untitled
Abstract: No abstract text available
Text: DS2172 PRELIMINARY D A LLA S DS2172 Bit Error Rate Tester BERT s e m ic o n d u c t o r PIN ASSIGNMENT FEATURES • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communica tions systems QÛOWÛOÛQ H H H - > > ŒŒC C
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OCR Scan
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DS2172
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PDF
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RN21
Abstract: No abstract text available
Text: DA LLA S DS2172 Bit Error Rate Tester BERT s e m ic o n d u c t o r FEATURES PIN ASSIGNMENT • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communica tions systems hO hQ hO >C O> Oi iO r Ûi Qr J_LLLU JJ_
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OCR Scan
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32-bit
DS2172
Switched-56,
RN21
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PDF
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Untitled
Abstract: No abstract text available
Text: Model 570 Linear IC Tester Now integrated circuits are easily identified and tested with B+K Precision’s new Handheld IC Testers. Two models, one for linear, one for digital ICs, are available, both with extensive built-in libraries. Small, handheld design is battery powered for portability in the field or
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Untitled
Abstract: No abstract text available
Text: n A I I A S s e m ic o n d u c to r FEATURES DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT • G enerates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital com m unica tions systems • O perates at speeds from DC to 52 MHz
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OCR Scan
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DS2172
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PDF
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Untitled
Abstract: No abstract text available
Text: n A I I A S s e m ic o n d u c to r FEATURES DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT • G enerates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital com m unica tions systems • O perates at speeds from DC to 52 MHz
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OCR Scan
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DS2172
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PDF
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Untitled
Abstract: No abstract text available
Text: . o o Ci »hI L10C23 64-bit Digital C orrelator □ FV IC E S IN C O R P Q R A T F D FEATURES □ High Speed 50 MHz , Low Power (125 mW ), CMOS 64-bit Digital Correlator □ Replaces Fairchild TDC1023 / TMC2023 □ Bit Can be Selectively Masked □ Three-State Outputs
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OCR Scan
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64-bit
TDC1023
TMC2023
MIL-STD-883,
24-pin
L10C23
C1023/TM
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PDF
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Untitled
Abstract: No abstract text available
Text: L10C23 64-bit Digital Correlator D E V IC E S IN C O R P O R A T E D FEATURES □ High Speed 50 MHz , Low Power (125 mW ), CMOS 64-bit Digital Correlator □ Replaces Fairchild TDC1023 / TMC2023 □ Bit Can be Selectively Masked □ Three-State Outputs □ Available 100% Screened to
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OCR Scan
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L10C23
64-bit
TDC1023
TMC2023
MIL-STD-883,
24-pin
L10C23
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PDF
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BEC26
Abstract: BEC10 th02 DS2172 PS24 PS25 PS26 PS27 PS28 PS29
Text: DS2172 DALLAS s e m ic o n d u c t o r FEATURES DS2172 Bit Error R a te T e s te r B E R T PIN ASSIGNMENT 1G enerates/D etects digital bit patterns for analyzing, evaluating and troubleshooting digital com m unica tions system s 1 — < O Q O W O O O Q
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OCR Scan
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DS2172
32-bit
BEC26
BEC10
th02
DS2172
PS24
PS25
PS26
PS27
PS28
PS29
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PDF
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schematic diagram atx Power supply 500w
Abstract: pioneer PAL 012A 1000w inverter PURE SINE WAVE schematic diagram 600va numeric ups circuit diagrams winbond bios 25064 TLE 9180 infineon smsc MEC 1300 nu TBE schematic diagram inverter 2000w DK55 circuit diagram of luminous 600va UPS
Text: QUICK INDEX NEW IN THIS ISSUE! Detailed Index - See Pages 3-24 Digital Signal Processors, iCoupler , iMEMS® and iSensor . . . . . 805, 2707, 2768-2769 Connectors, Cable Assemblies, IC Sockets . . . . . . . . . . . 28-568 RF Connectors . . . . . . . . . . . . . . . . . . . . . . Pages 454-455
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P462-ND
P463-ND
LNG295LFCP2U
LNG395MFTP5U
US2011)
schematic diagram atx Power supply 500w
pioneer PAL 012A
1000w inverter PURE SINE WAVE schematic diagram
600va numeric ups circuit diagrams
winbond bios 25064
TLE 9180 infineon
smsc MEC 1300 nu
TBE schematic diagram inverter 2000w
DK55
circuit diagram of luminous 600va UPS
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PDF
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TDC1023
Abstract: U/25/20/TN26/15/850/TDC1023/TM
Text: L ô Ô f Ô L 1 0 C 2 3 64-bit Digital Correlator D E V IC E S IN C O R P O R A T E D 'RIPTION □ H igh Speed 50 MHz , Low Pow er (125 mW), CMOS 64-bit Digital C orrelator □ Replaces TRW /R aytheon TDC1023/TMC2023 □ □ □ □ Bit Can be Selectively M asked
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OCR Scan
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64-bit
TDC1023/TMC2023
MIL-STD-883,
24-pin
28-pin
L10C23
TDC1023/TM
TDC1023
U/25/20/TN26/15/850/TDC1023/TM
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PDF
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DIGITAL IC TESTER
Abstract: ic tester ttl IC TESTER ABI Electronics
Text: Analogue and Digital Handheld IC Testing of circu n O S2 R Extensive Built-in Test Libraries The LinearMaster Compact Professional includes all common analogue ICs including op-amps, comparators, voltage regulators, voltage references, analogue switches & multiplexers, optoisolators & couplers and audio ICs.
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RS-232
DIGITAL IC TESTER
ic tester
ttl IC TESTER
ABI Electronics
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PDF
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DIGITAL IC TESTER
Abstract: ic tester LinearMaster ttl IC TESTER
Text: Analogue and Digital Handheld IC Testing State of the Art Technology Very large scale integration allows advanced functionality and ease of use to be combined in the Compact Range’s hand-held, battery operated units. The 2 line x 16 character dot matrix LCD shows
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DIGITAL IC TESTER
Abstract: ic tester LinearMaster ttl IC TESTER usb connector 2076 "ABI Electronics"
Text: Analogue and Digital Handheld IC Testing For DIL and SMT devices it n RS2 Extensive Built-in Test Libraries The LinearMaster Compact Professional includes all common analogue ICs including op-amps, comparators, voltage regulators, voltage references, analogue switches & multiplexers, optoisolators & couplers and audio ICs.
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Original
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RS-232
DIGITAL IC TESTER
ic tester
LinearMaster
ttl IC TESTER
usb connector 2076
"ABI Electronics"
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PDF
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3z fuse
Abstract: PAL VIHH programming pulse PAL20L8A PAL20R4A MASK L-M-38510
Text: M I L - M - 38510/60 5 USAF 30 August 1984 M I LITARY SPECIFICATION MI CR OCIRCUITS, DIGITAL, BIPOLAR PR OG RAMMABLE LOGIC, MONO LI TH IC SILICON This specif ic at io n is approved for use by the De pa r t m e n t of the Air Force, and is available for use by all Departments and Agencies of the Depa rt me nt
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OCR Scan
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MIL-M-38510/505
MIL-M-38510
MIL-M-38510.
PAL20L8A/Monolithic
PAL20L8A/National
PAL20R8A/Monolithic
PAL20R8A/National
PAL20R6A/Mono
PAL20R6A/National
PAL20R4A/Monolithic
3z fuse
PAL VIHH programming pulse
PAL20L8A
PAL20R4A MASK
L-M-38510
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PDF
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5170 PH 51
Abstract: DD330 VES 470M ml232 ICL 4050 LTPD sm 126 ao 2FJ MARKING
Text: . M I L- M- 38 51 0/ 23 5C I JUALIF IC A T ION I 25 Mav 1984 I 1 S U P E R S E D ING-M I L- M- 38 51 0/ 23 5B 24 May 1982 REQU IR EM EM T I REMOVED I MILITARY SP ECIFICATION MICROCIRCUIT, DIGITAL, MOS, 4096 BIT RANDOM A C CE SS MEMORY M ONO LI TH IC SILICON
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OCR Scan
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MIL-M-38510/235C
MIL-M-38510/235B
705-040/A3437
5170 PH 51
DD330
VES 470M
ml232
ICL 4050
LTPD
sm 126 ao
2FJ MARKING
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PDF
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DB50 connector
Abstract: FB100 FB100A CD 4501 FB2000A IEEE488 RS-449 prbs noise generator OP210 IEEE-448
Text: Fastbit FB100A BER Test System Highly flexible BER test system for serial and parallel testing over a wide range of interfaces from TTL to optical. Addresses system, sub-system and component testing during development and compliance verification in IC, cable, satellite, cellular, terrestrial, CATV, digital TV and other physical
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Original
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FB100A
RS-422
DB50 connector
FB100
CD 4501
FB2000A
IEEE488
RS-449
prbs noise generator
OP210
IEEE-448
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PDF
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DB50 connector
Abstract: DB50 FB100 IEEE-448 RJ45 modular jack FB100A mds wireless broadband specifications tv pattern generator FB2000A IEEE488
Text: Fastbit FB100A BER Test System Highly flexible BER test system for serial and parallel testing over a wide range of interfaces from TTL to optical. Addresses system, sub-system and component testing during development and compliance verification in IC, cable, satellite, cellular, terrestrial, CATV, digital TV and other physical
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Original
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FB100A
RS-422
DB50 connector
DB50
FB100
IEEE-448
RJ45 modular jack
mds wireless broadband
specifications tv pattern generator
FB2000A
IEEE488
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PDF
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