RAD6000
Abstract: NA-GSFC-2005-04 HCN58C1001 EEPROM retention testing EEPROM retention bake screening GSFC SCS750 RAD6000 processor architecture 79LV0408RPFE-20 28C011TRPFS-12
Text: Review of GSFC NASA Advisory NA-GSFC-2005-04 Part Types: Models: Manufacturer: EEPROM All EEPROM Models Maxwell Technologies Lot Date Codes: All LDC’s Document: 1009322 Revision: Date: 2 March 24, 2006 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States |
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NA-GSFC-2005-04
RAD6000
NA-GSFC-2005-04
HCN58C1001
EEPROM retention testing
EEPROM retention bake screening
GSFC
SCS750
RAD6000 processor architecture
79LV0408RPFE-20
28C011TRPFS-12
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AT28HC64B-W
Abstract: AT28BV64B-W AT28C16-W M2010 M5004
Text: Features • • • • • • • • • • • • • High Performance CMOS Technology Low Power Dissipation - Active and Standby Hardware and Software Data Protection Features DATA Polling for End of Write Detection High Reliability – Endurance:
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0554D
AT28HC64B-W
AT28BV64B-W
AT28C16-W
M2010
M5004
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EEPROM retention testing
Abstract: flash "high temperature data retention" mechanism ANH005 P1005 flash Activation Energy
Text: Hybrid Memory Products Ltd Floating Gate Memory Arrays Retention Issues Introduction This document reviews the nature of Data Retention, and presents approaches to its specification and verification based upon procedures defined in the following IEEE publication:
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P1005
150oC
32LCC)
EEPROM retention testing
flash "high temperature data retention" mechanism
ANH005
flash Activation Energy
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QNEE9801
Abstract: stmicroelectronics traceability
Text: QNEE9801 QUALITY NOTE High Reliability Certified Flow HRCF The High Reliability Certified Flow has been developed by STMicroelectronics for sensitive applications, such as security automotive and medical applications, that need a very high level of reliability (with the
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QNEE9801
QNEE9801
stmicroelectronics traceability
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EEPROM Die Products
Abstract: Atmel AT28C256-DWFM19104 EEPROM retention bake screening AT28HC256-DWFM19104 AT28BV256-DWF AT28BV64B-DWF AT28C16-DWF M2010 M5004
Text: Features • • • • • • • • • • • • High Performance CMOS Technology Low Power Dissipation – Active and Standby Hardware and Software Data Protection Features DATA Polling for End of Write Detection High Reliability – Endurance: • 104 Cycles
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0554F
EEPROM Die Products
Atmel
AT28C256-DWFM19104
EEPROM retention bake screening
AT28HC256-DWFM19104
AT28BV256-DWF
AT28BV64B-DWF
AT28C16-DWF
M2010
M5004
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sugar centrifuge
Abstract: EEPROM retention bake screening
Text: Product Quality A CORPORATE COMMITMENT Microchip Technology Inc. has evolved a culture where a commitment to quality is an integral part. By empowering every employee to be responsible for the quality of their work, the entire corporation is involved in the
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DS00047G-page
sugar centrifuge
EEPROM retention bake screening
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flash "high temperature data retention" mechanism
Abstract: EEPROM retention testing BEST BIOS PROGRAMMING AND DATA FOR EEPROM EEPROM retention bake screening SST superflash
Text: Reliability Considerations for Reprogrammable Nonvolatile Memories Technical Paper 1.0 INTRODUCTION When acquiring a microcircuit, many considerations above and beyond the purchase price are important. Among these are quality, reliability, delivery, service, and
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BEST BIOS PROGRAMMING AND DATA FOR EEPROM
Abstract: TRANSISTOR A117 flash "high temperature data retention" mechanism EEPROM retention testing DSASW0016486
Text: Reliability Considerations for Reprogrammable Nonvolatile Memories Reliability Considerations for Reprogrammable Nonvolatile Memories INTRODUCTION When acquiring a microcircuit, many considerations above and beyond the purchase price are important. Among these are quality, reliability, delivery, service, and product
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S72021-00-000
BEST BIOS PROGRAMMING AND DATA FOR EEPROM
TRANSISTOR A117
flash "high temperature data retention" mechanism
EEPROM retention testing
DSASW0016486
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24XX256
Abstract: DK-2750 PIC18LF4320
Text: TB072 FLASH Memory Technology: Considerations for Application Design Author: Rodger Richey Microchip Technology Inc. INTRODUCTION Many times, choosing a FLASH memory device is driven by which manufacturer has the cheapest offering. Regardless of its use as a stand-alone device or as
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TB072
DK-2750
D-85737
DS91072A-page
24XX256
PIC18LF4320
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wafer incoming
Abstract: EEPROM retention bake screening
Text: Configuration Elements & Reliability June 1996, ver. 3 Data Sheet Introduction Altera’s broad range of programmable logic devices PLDs incorporates four types of configuration elements: EPROM, EEPROM, FLASH, and SRAM. To ensure the highest level of device performance and reliability,
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15-month
wafer incoming
EEPROM retention bake screening
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Untitled
Abstract: No abstract text available
Text: Configuration Elements & Reliability June 1996, ver. 3 Data Sheet Introduction Altera’s broad range of programmable logic devices PLDs incorporates four types of configuration elements: EPROM, EEPROM, FLASH, and SRAM. To ensure the highest level of device performance and reliability,
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15-month
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atmel 438
Abstract: Atmel 546 atmel 446 ATMEL 1230 atmel 735 atmel 532 ATMEL 745 ATMEL 920 atmel 1044 ATMEL 1237
Text: Features • • • • • • • • • • • • • High Performance CMOS Technology Low Power Dissipation - Active and Standby Hardware and Software Data Protection Features DATA Polling for End of Write Detection High Reliability – Endurance: 104 Cycles
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0554C
06/98/xM
atmel 438
Atmel 546
atmel 446
ATMEL 1230
atmel 735
atmel 532
ATMEL 745
ATMEL 920
atmel 1044
ATMEL 1237
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28C513
Abstract: qml-38535 28C512 5962-E079-07
Text: REVISIONS LTR DESCRIPTION DATE YR-MO-DA APPROVED A Changes in accordance with NOR 5962-R114-92. glg 92-01-22 Michael A. Frye B Changes in accordance with NOR 5962-R160-98. glg 98-08-06 Raymond Monnin C Boilerplate update and part of five year review. tcr
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5962-R114-92.
5962-R160-98.
28C513
qml-38535
28C512
5962-E079-07
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AC243003
Abstract: 24c16 EEPROM sample code 93XX66A 24C16 serial eeprom 24C16 24LCXX 25LCXX AEC-Q100 MICROWIRE eeprom interface PIC 24C16
Text: Automotive Memory Products Serial EEPROM Powered for Automotive www.microchip.com/memory Microchip Serial Memory Products Microchip Technology has developed industry-leading processes for each step in the design, manufacturing and testing phases of its serial EEPROMs, and has become one of the most respected leaders in supply of these devices to the automotive
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25LCXX
24LCXX
93LCXX
11LCXX
P-8870
DS22078C
DS22078D*
AC243003
24c16 EEPROM sample code
93XX66A
24C16 serial eeprom
24C16
24LCXX
25LCXX
AEC-Q100
MICROWIRE eeprom interface
PIC 24C16
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Untitled
Abstract: No abstract text available
Text: PS-AT28C010 revision C MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K x 8-Bit PARALLEL EEPROM, MONOLITHIC SILICON Revision Written by Approved by Date C S.JAMES C. FERRE 03/01/08 1/24 PS-AT28C010 Rev C DOCUMENTATION CHANGE NOTICE Date of update Revision letter
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PS-AT28C010
AT28C010
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ATMEL 0828
Abstract: at28c010 ATMEL Packing method EEPROM retention bake screening AT28C010-12DK-MQ AT28C010-12DK-SV
Text: PS-AT28C010 revision C MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K x 8-Bit PARALLEL EEPROM, MONOLITHIC SILICON Revision Written by Approved by Date C S.JAMES C. FERRE 03/01/08 1/24 PS-AT28C010 Rev C DOCUMENTATION CHANGE NOTICE Date of update Revision letter
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PS-AT28C010
AT28C010
ATMEL 0828
ATMEL Packing method
EEPROM retention bake screening
AT28C010-12DK-MQ
AT28C010-12DK-SV
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Untitled
Abstract: No abstract text available
Text: APPLICATION NOTE QUALITY AND RELIABILITY INFORMATION by the Micro Divisions INTRODUCTION We think that maintaining an optimal quality level is very important but we also believe that our customers contribute to the quality chain when they handle or program
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EPROM retention bake
Abstract: mass flow meter evaluation kit
Text: APPLICATION NOTE QUALITY AND RELIABILITY INFORMATION by the Micro Divisions INTRODUCTION We think that maintaining an optimal quality level is very important but we also believe that our customers contribute to the quality chain when they handle or program our MCU devices This
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CHAINAN902/0299
EPROM retention bake
mass flow meter evaluation kit
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development trends in car manufacture
Abstract: EPROM retention bake VR02105B
Text: APPLICATION NOTE QUALITY AND RELIABILITY INFORMATION by the Micro Divisions INTRODUCTION We think that maintaining an optimal quality level is very important but we also believe that our customers contribute to the quality chain when they handle or program
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Untitled
Abstract: No abstract text available
Text: EEPROM Reliability The reliability of AMD's NS-18 process used in the fabrication of 64K EEPROMs is described in this report. The reliability monitors used at AMD were designed to predict the future operating life results by accelerat ing failure rates. The monitors include data from endur
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NS-18
Am2864AE/BE
Am2864B
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transistor 2002b
Abstract: No abstract text available
Text: Configuration Elements & Reliability Introduction Altera's broad range of program m able logic devices incorporates four types of configuration elements: EPRO M , EEPROM , FLASH, and SRAM . To ensure the highest level of device perform ance and reliability, Altera
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smd UJ
Abstract: CDFP4-F28 GDIP1-T28 SMD MARKING CODE sdp
Text: DATE DESCRIPTION LTR APPROVED YR-Ho-PA A A d d e d case ou t l i n e le t t e r U t o the drawing. Re m o v e d E S D S r e q u i r e m e n t s froit; drawing. E d i t o r i a l c h an ge s th roughout. 90 -0 1- 26 ' M. A. Frye B R e m o v e d "D e l a y to n e x t wr i t e " \tDVWL, t DV£L) test
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BUL-103.
MIL-BUL-103
00X07^
smd UJ
CDFP4-F28
GDIP1-T28
SMD MARKING CODE sdp
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Untitled
Abstract: No abstract text available
Text: REVISIONS LTR APPROVED DESCnPTWN REV SHEET REV SHEET REV STATUS OF SHEETS REV SHEET 10 11 14 12 13 15 16 17 18 19 PMCN/A STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUITS, MEMORY, DIGITAL, CMOS 2K X 8 EEPROM, MONOLITHIC SILICON
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DESCIVPT10N
74HJW40911
5962-E944
1/Oof02JX
5962-8867602LX
5962-8867602XX
1FN41
1AT28HC16L-70DM/88
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4431B
Abstract: smd marking 4431b 60395 5962-38267 28C010 qml-38535
Text: _ REVISIONS_ _ LTR_ DESCRIPTION_ DATE YR-HO-PA _ APPROVED A Add packages T and W. Add vendor CAGE 60395 as 93-06-29 M. A. Frye source of supply. Increase data retention to
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000002e]
4431B
smd marking 4431b
60395
5962-38267
28C010
qml-38535
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