VCC1
Abstract: MTTF MTTF test data
Text: VCC1 SERIES FITS RATE AND MTTF LONG-TERM FAILURE RATES Using the previous cumulative ceramic oscillators life test data, the failure rates in FITs failure in billion device-hours of operation and Mean Time To Failures (MTTF) at both 60% and 90% confidence levels are depicted in the following
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MTTF
Abstract: VC-706 failure rate VC70 VC706
Text: VC-706 PECL FITS RATE AND MTTF LONG-TERM FAILURE RATES Using the previous cumulative ceramic oscillators life test data, the failure rates in FITs failure in billion device-hours of operation and Mean Time To Failures (MTTF) at both 60% and 90% confidence levels are depicted in the following
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VC-706
MTTF
failure rate
VC70
VC706
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72483
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2296 248 147 113 3.667 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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JESD85,
28-Jul-08
18-Jul-08
72483
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U.S. Sensor
Abstract: No abstract text available
Text: Reliability Testing MEASUREMENT CAPABILITIES « Previous Continue » Failure Analysis In the event that you should experience a problem with a U.S. Sensor thermistor or probe assembly, our test facilities and experienced personnel are available to perform failure analysis on your
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Novacap
Abstract: mtbf 90 2004 FAILURE
Text: Class II 200ºC Operational Life Test Data Failure Rates at 90% Confidence Test Conditions: Time Period: Number of Capacitors Tested: Testing Location: Results: Conversion Factors: 2000hrs. @ 200ºC. Applied voltage is dependent on capacitors tested. March 2004 to July 2007.
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2000hrs.
Novacap
mtbf
90 2004
FAILURE
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SOP 8 200MIL
Abstract: No abstract text available
Text: TOSHIBA [13] Reliability Data 13. Reliability Data Intrinsic Failure Rate Estimation from Life Test Results 1995/3Q-1996/2Q Data Test Condition :Ta = 125°C, Vcc = 6.0V Operation 1000Hrs. Device 4120 Ta = 60°C Equivalent Device Hours Ea = 0.8V 391.15x106
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1995/3Q-1996/2Q
1000Hrs.
15x106
TSSOP-16
TSSOP-20
300cyde
100Hrs.
TSSOP-14
SOP 8 200MIL
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Untitled
Abstract: No abstract text available
Text: Cell-Based IC Metastability Evaluation Background Test Results The failure of synchronisation when latching asynchronous signals has been investigated on a test IC using StandardLib and PadLib2 cells. The evaluation presented in this Application Note is based on measurements conducted
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temptronic TP03000A
Abstract: NXR-1400 INCOMING RAW MATERIAL INSPECTION procedure Sample form for INCOMING Inspection of RAW MATERIAL INCOMING MATERIAL INSPECTION procedure INCOMING MATERIAL FLOW PROCESS FOR GENERAL FABRICATION UNIT TP04000 nicolet nxr1400 TRIO TECH
Text: QUALITY CONTROL FLOW LG Semicon CONTENTS PAGE 1. Introduction . 2. Q uality A ssurance System 3. R eliability Test . 13 . 30 4. Failure M ode A n alysis .
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AEC-Q100-004
Abstract: JESD22-A113 HDJD-J822
Text: HDJD-J822 Color Management System Feedback Controller Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of JEDEC. Avago
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HDJD-J822
AEC-Q100-004
/-100mA)
JESD22-A113-A
5989-4106EN
AEC-Q100-004
JESD22-A113
HDJD-J822
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Optical Encoder Modules
Abstract: HEDL-5500 HEDL-5600 HEDL-6500
Text: HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series Motion Sensing Products, Optical Encoder Modules Reliability Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies Malaysia
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HEDL-5500,
HEDL-5600,
HEDL-6500,
HEDL-9x00
characteristi760
15min
AV01-0682EN
Optical Encoder Modules
HEDL-5500
HEDL-5600
HEDL-6500
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AVAGO DIP
Abstract: No abstract text available
Text: HLMP-DB25, HLMP-KB45 T-1 ¾ 5mm , T1 (3mm) Blue LED Lamps Reliability Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of
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HLMP-DB25,
HLMP-KB45
MIL-STD-883
C7021.
AV01-0168EN
AVAGO DIP
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JESD-B-102
Abstract: AVAGO DIP JESD-A102 JA113
Text: ACPL-M71U, ACPL-M72U Wide Operating Temperature High Speed, Low Power CMOS Digital Optocoupler with R2CouplerTM Isolation Reliability Data Sheet Description Definition of Failure The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done
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ACPL-M71U,
ACPL-M72U
JESD-A110
15psig
JESD-A102
JESD-A103
AV02-3713EN
JESD-B-102
AVAGO DIP
JESD-A102
JA113
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MIL-STD-883 Method 3015.7
Abstract: EIA-583 H820 EIA 583
Text: VISHAY Vishay Telefunken Life Test Data for IRDC Modules Technology includes : TFDS3xxx, TFDx4xxx, TFDx6xxx Predicted failure rate (FITs), based on accelerated life testing At 60% upper confidence level derated to 55°C assuming the activation energy to be 0.8 eV.
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TFDx3000/4xxx
Failures/109
EIA-583
22-A113.
22-A113
MILSTD-883
MIL-STD-883 Method 3015.7
EIA-583
H820
EIA 583
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MM-JESD22-A115-A
Abstract: JESD22-A115 AEDR-8400-140 AEDR-8400-142 HBM-JESD22-A114D
Text: AEDR-8400-140 and AEDR-8400-142 Reflective Surface Mount Optical Encoder Reliability Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies Malaysia in accordance with the latest revisions of JEDEC Standard.
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AEDR-8400-140
AEDR-8400-142
by22-A115-A
20-2kHz,
AV02-0370EN
MM-JESD22-A115-A
JESD22-A115
AEDR-8400-142
HBM-JESD22-A114D
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JESD22-B104-B
Abstract: JESD22-b103 JESD22-B104 iP1201 transistor Amp 2054 equivalent C1173 JESD22-B103B JESD22-B103-B
Text: International Rectifier Reliability Report for iPOWIR Family iP1001, iP1201, iP1202, iP2001, iP2002, iP2003 20-Apr-04 iPOWIR Family Reliability Testing Summary 4/20/2004 1 . HTOL - High Temperature Operating Life Test Failure Rate Device Number Conditon Samples
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iP1001,
iP1201,
iP1202,
iP2001,
iP2002,
iP2003
20-Apr-04
iP1001
iP2001
iP2002
JESD22-B104-B
JESD22-b103
JESD22-B104
iP1201
transistor Amp 2054 equivalent
C1173
JESD22-B103B
JESD22-B103-B
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motherboard check point
Abstract: motherboard no display MotherBoard troubleshooting
Text: Chapter 6 Page 1 of25 Troubleshooting Guidelines Chapter 6 Troubleshooting Guidelines Trouble Shooting List 6.1 No display 6.2 VGA controller failure 6.3 LCD no display / Invalid picture 6.4 External monitor has no display or color incorrect 6.5 Memory test error
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HEDS-5500
Abstract: HEDS-6500 HEDS-9000
Text: HEDS-5500, HEDS-6500 and HEDS-9000, 9100, 9200 Series Motion Sensing Products, Optical Encoder Modules Reliability Data Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of MIL- STD-883.
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HEDS-5500,
HEDS-6500
HEDS-9000,
STD-883.
MIL-STD-883C
5965-2775E
5965-9642E
HEDS-5500
HEDS-9000
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2005 Z
Abstract: R 753 tcr-125 TCR55 S10K 22-315
Text: CHINA 752 & 753 SERIES QUALIFICATION DATA FOR THE YEAR 2005 RES TEST BL# LET VALUE MIN MAX AVG RES QTY PARTS TOTAL PER PART TESTED FAILURE RESISTORS REPORT QTR PARTS RES FAILED FAILED PART SERIES YEAR NUMBER IN RES 19747 D 100/1K - - - 12 80 - 1 752
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100/1K
753091331G
22316S
753091103G
752QA1
2005 Z
R 753
tcr-125
TCR55
S10K
22-315
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Untitled
Abstract: No abstract text available
Text: VISHAY BCCOMPONENTS Capacitors Application Note Voltage Proof Test for Metalized Film Capacitors Voltage proof tests, also called “high pot” tests, are used to check if a capacitor has a breakdown failure mode occurring at a certain test voltage. The detection of breakdown is done by a current detection, specified if exceeding a certain limit cut off
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XAPP077
Abstract: xilinx MTBF 1014 1987 flip-flop IEEE Standard 1014-1987 XC7000 XC7300 XC9500
Text: Metastability Considerations XAPP077 January, 1997 Version 1.0 Application Note Summary Metastability is unavoidable in asynchronous systems. However, using the formulas and test measurements supplied here, designers can calculate the probability of failure. Design techniques for minimizing metastability are also provided.
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XAPP077
XC7300,
XC9500
xilinx MTBF
1014 1987
flip-flop
IEEE Standard 1014-1987
XC7000
XC7300
XC9500
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iec 947-4
Abstract: Allen-Bradley contactors 100C bs 5424 Allen-Bradley 104-c VDE 0660 BS 5424 193 RELAY Allen-Bradley heater elements IEC 947-4 VDE 0660 OVERLOAD RELAY bs5424
Text: SELECTION GUIDE BULLETlN 193 MCS-T BIMETALLIC OVERLOAD RELAYS Bulletin 193-T l l Phase Failure Sensitivity Temperature Compensation l Auxiliary Switch 1 Normally Open and 1 Normally Closed Contact l Test/Stop Button l Manual/Auto Reset Button l Individual Mounting
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193-T
iec 947-4
Allen-Bradley contactors 100C
bs 5424
Allen-Bradley 104-c
VDE 0660 BS 5424
193 RELAY
Allen-Bradley heater elements
IEC 947-4 VDE 0660
OVERLOAD RELAY
bs5424
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Untitled
Abstract: No abstract text available
Text: N AMER PHILIPS/DISCRETE fl7D D bbS3T31 COOTS47 5 11 . T -01-01 LID RELIABILITY DATA | UNIT HOURS #O F FAILURES FAILURE RATE* 1483 1,475,840 2 .21 1520 1,519,000 .06 TEMPERATURE # F UNITS Operating Life T ,= 150°C Storage Life Ta = 150°C ' test • . l| §
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bbS3T31
COOTS47
Failures/1000
MIL-STD-690B.
LTA101A
LTA320
LTA324
LTA741
LTA741C
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capacitor 680pf cog x7r
Abstract: 5750 2220 Ceramic Capacitors Capacitor 47uf 100V 1210 x7r
Text: ST Series Soft Termination Multilayer Ceramic Chip Capacitors MERITEK RoHS FEATURES • • • • • • • Wide capacitance range in a given size High performance to withstanding 5mm of substrate bending test guarantee Reduction in PCB bend failure Lead free terminations
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LSI402Z
Abstract: LSI402ZX dB06 Internal ROM Booting
Text: Troubleshooting Guide for LSI402Z/ZX-Based Systems Application Note Contents 1 2 3 DB06-000269-00 Introduction What to look for after reset 2.1 Clock output 2.2 Internal booting - self test 2.3 External booting Possible failure symptoms and causes 3.1 Applying power
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LSI402Z/ZX-Based
DB06-000269-00
LSI402Z/ZX-Based
LSI402Z
LSI402ZX
LSI402ZX
dB06
Internal ROM Booting
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