Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    GENERIC FAILURE RATE ELECTRONIC DEVICE Search Results

    GENERIC FAILURE RATE ELECTRONIC DEVICE Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    TPD4164F Toshiba Electronic Devices & Storage Corporation Intelligent power device / VBB=600V / Iout=2A/ Surface mount type / HSSOP31 Visit Toshiba Electronic Devices & Storage Corporation
    TPD4207F Toshiba Electronic Devices & Storage Corporation Intelligent power device 600V (High voltage PWM DC brushless motor driver) Visit Toshiba Electronic Devices & Storage Corporation
    TPD4204F Toshiba Electronic Devices & Storage Corporation Intelligent power device 600V (High voltage PWM DC brushless motor driver) Visit Toshiba Electronic Devices & Storage Corporation
    TPD4164K Toshiba Electronic Devices & Storage Corporation Intelligent power device / VBB=600V / Iout=2A/ Through hole type / HDIP30 Visit Toshiba Electronic Devices & Storage Corporation
    TPD4163K Toshiba Electronic Devices & Storage Corporation Intelligent power device / VBB=600V / Iout=1A/ Through hole type / HDIP30 Visit Toshiba Electronic Devices & Storage Corporation

    GENERIC FAILURE RATE ELECTRONIC DEVICE Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    generic failure rate electronic device

    Abstract: TC35856F "network interface cards"
    Text: TOSHIBA TC35856F 155 Mbps ATM PCI-SAR Features Description – – – – – – – The TC35856F is a single-chip, 155 Megabits per second Mbps segmentation assembly and reassembly (SAR) device with a PCI interface. It has hardware implemented ATM Forum-compliant


    Original     		PDF TC35856F TC35856F, generic failure rate electronic device "network interface cards"

    Untitled

    Abstract: No abstract text available
    Text: AOS Semiconductor Product Reliability Report AOZ8175DI, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOZ8175DI. Review of the electrical test results confirm that AOZ8175DI pass AOS quality and reliability


    Original     		PDF AOZ8175DI, AOZ8175DI. AOZ8175DI 2x5x77x168x258] 10-5eV

    Untitled

    Abstract: No abstract text available
    Text: AOS Semiconductor Product Reliability Report AOZ8170DT, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOZ8170DT. Review of the electrical test results confirm that AOZ8170DT pass AOS quality and reliability


    Original     		PDF AOZ8170DT, AOZ8170DT. AOZ8170DT 2x5x77x168x258] 10-5eV

    TL431 zener

    Abstract: ferrite TRANSFORMER calculation transformer mtbf Zener Diode tl431 generic failure rate electronic equipment generic failure rate electronic device transistor MTBF MIL-HDBK-217F generic failure rate regulator mtbf
    Text: Switching Power Supply/Adaptor MTBF Report CSS65 Part No. : Description : 2 X 4 Medical series Date : 2009.04.02 MTBF Model The calculation is based on MIL-HDBK-217F, Notice 1, Appendix A: Parts Count Reliability. The prediction were performed with the power supply operating in a Ground Benign Gb controlled environment


    Original     		PDF CSS65 MIL-HDBK-217F, MIL-HDBK-217F TL431/Zener TL431 zener ferrite TRANSFORMER calculation transformer mtbf Zener Diode tl431 generic failure rate electronic equipment generic failure rate electronic device transistor MTBF MIL-HDBK-217F generic failure rate regulator mtbf

    EMI filter ferrite bead mtbf

    Abstract: transformer mtbf generic failure rate electronic device TL431 zener ferrite TRANSFORMER calculation Zener Diode tl431 TL431 transistor transformer calculation MIL-HDBK-217F transistor MTBF
    Text: Switching Power Supply/Adaptor MTBF Report CSS150 SERIES Part No. : Description : 12Vdc/12.5Amp Sample Date : 2009.09.21 MTBF Model The calculation is based on MIL-HDBK-217F, Notice 1, Appendix A: Parts Count Reliability. The prediction were performed with the power supply operating in a Ground Benign (Gb) controlled environment


    Original     		PDF CSS150 12Vdc/12 MIL-HDBK-217F, MIL-HDBK-217F TL431/Zener EMI filter ferrite bead mtbf transformer mtbf generic failure rate electronic device TL431 zener ferrite TRANSFORMER calculation Zener Diode tl431 TL431 transistor transformer calculation MIL-HDBK-217F transistor MTBF

    electronic energy meters

    Abstract: Analog Devices Single Phase analog Energy Meter ic measurement electronic schematic energy meter
    Text: I N D U S T R Y P E R S P E C T I V E IC Technology and Failure Mechanisms Understanding reliability standards can raise quality of meters Guest column by Etienne Moulin, Analog Devices Inc. Electronic energy meters and electronic components reliability Today, utilities operate in a competitive


    Original     		PDF

    Untitled

    Abstract: No abstract text available
    Text: Future Technology Devices International Ltd TTL-232RG TTL to USB Serial Converter Generic Cables Datasheet Document Reference No.: FT_000188 Version 1.1 Issue Date: 2009-04-02 Future Technology Devices International Limited FTDI Unit 1, 2 Seaward Place, Glasgow G41 1HH, United Kingdom


    Original     		PDF TTL-232RG TTL-232RG-VIP-WE

    TTL-232RGVREG1V8-WE

    Abstract: FT232RQ TTL-232RG-VIP-WE UL2464 ft232r MAX232 vdrive2, using c TTL-232RG VMUSIC2 FT232R TTL-232RG-VSW5V-WE
    Text: Future Technology Devices International Ltd TTL-232RG TTL to USB Serial Converter Generic Cables Datasheet Document Reference No.: FT_000188 Version 1.1 Issue Date: 2009-04-02 Future Technology Devices International Limited FTDI Unit 1, 2 Seaward Place, Glasgow G41 1HH, United Kingdom


    Original     		PDF TTL-232RG TTL-232RG-VIP-WE TTL-232RGVREG1V8-WE FT232RQ UL2464 ft232r MAX232 vdrive2, using c TTL-232RG VMUSIC2 FT232R TTL-232RG-VSW5V-WE

    MBH2BT01

    Abstract: No abstract text available
    Text: Bluetooth CompactFlash-Sized Card TM MBH2BT01 Summary The MBH2BT01 is a CompactFlash-sized card featuring the BluetoothTM wireless technology. Capable of wireless communications with other BluetoothTMcompliant devices for message exchange or receiving/ sending files.


    Original     		PDF MBH2BT01 MBH2BT01 AD51-01444-1C

    disadvantages of the energy meter

    Abstract: energy meter circuit diagram of GEC digital frequency meter circuit diagram Prepayment Electricity Meter electricity meters energy meter circuit diagram Block diagram of DSP based Power meter dual slope adc ENERGY SAVING UNIT AC Diagram accuracy on electromechanical meters
    Text: SOLID STATE SOLUTIONS FOR ELECTRICITY METROLOGY Anthony Collins Analog Devices Inc., Wilmington MA 01887, USA Email: [email protected] 1.0 Introduction Significant changes are taking place in the electric energy industry worldwide. Deregulation of the


    Original     		PDF

    1769-SDN

    Abstract: 1769-sdn scanner micrologix 1500 error codes RSNETWORX CONFIGURATION 1770-KFD 1764-LRP Allen-Bradley 1485C DeviceNet cable CNET-UM001 1485A-C2 1769-UM009C-EN-P
    Text: Compact I/O 1769-SDN DeviceNet Scanner Module 1769-SDN User Manual Important User Information Solid state equipment has operational characteristics differing from those of electromechanical equipment. Safety Guidelines for the Application, Installation and Maintenance of Solid State Controls Publication SGI-1.1


    Original     		PDF 1769-SDN 1769-UM009C-EN-P 1769-UM009B-EN-P 1769-SDN 1769-sdn scanner micrologix 1500 error codes RSNETWORX CONFIGURATION 1770-KFD 1764-LRP Allen-Bradley 1485C DeviceNet cable CNET-UM001 1485A-C2

    ESCC 4001

    Abstract: ESCC 4001/026 p0603 VMN-SG21 CS22 CS33 RMK22N RMK515N RMK55N VMN-SG2135-1007
    Text: V i s h ay I n t e r t e c h n o l o g y, I n c . High Reliability Products Features • CECC qualified • ESCC qualified Space level and R Failure Rate • ESCC QML qualification • Products to Source Control Drawing APPLICATIONS • Space (satellites, launcher, International Space Station)


    Original     		PDF VMN-SG2135-1007 ESCC 4001 ESCC 4001/026 p0603 VMN-SG21 CS22 CS33 RMK22N RMK515N RMK55N VMN-SG2135-1007

    transistor MTBF

    Abstract: thyristor 106 generic failure rate failure rate fuse generic failure rate electronic device Thyristor SCR DSA00347 failure rate connector "failure rate" fuse thyristor MTBF
    Text: MTBF Report KMS40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMS40-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF thyristor 106 generic failure rate failure rate fuse generic failure rate electronic device Thyristor SCR DSA00347 failure rate connector "failure rate" fuse thyristor MTBF

    transistor MTBF

    Abstract: generic failure rate electronic device generic failure rate
    Text: MTBF Report KMS15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMS15-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF generic failure rate electronic device generic failure rate

    transistor MTBF

    Abstract: failure rate fuse generic failure rate generic failure rate electronic device varistor rectifier generic failure rate electronic equipment Thyristor SCR
    Text: MTBF Report KMT15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMT15-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF failure rate fuse generic failure rate generic failure rate electronic device varistor rectifier generic failure rate electronic equipment Thyristor SCR

    generic failure rate

    Abstract: transistor MTBF Thyristor SCR ferrite fuse failure rate fuse "failure rate" fuse generic failure rate electronic equipment generic failure rate electronic device Quality Thermistor ceramics SCR 612
    Text: MTBF Report KMT40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMT40-xx MIL-HDBK-217f, failures/106 Failures/10 generic failure rate transistor MTBF Thyristor SCR ferrite fuse failure rate fuse "failure rate" fuse generic failure rate electronic equipment generic failure rate electronic device Quality Thermistor ceramics SCR 612

    generic failure rate

    Abstract: generic failure rate electronic device failure rate fuse 0638 ferrite fuse "failure rate" fuse
    Text: MTBF Report KMD15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMD15-xx MIL-HDBK-217f, failures/106 Failures/10 generic failure rate generic failure rate electronic device failure rate fuse 0638 ferrite fuse "failure rate" fuse

    quality acceptance plan

    Abstract: JESD22-102 JESD22-105 generic failure rate electronic device JESD22-A103 JESD22-A108 JESD22-A101 JESD22-A102 Fairchild wafer fab processes outgoing quality
    Text: QUALITY Reliability Qualification Program Fairchild Semiconductor is committed to delivering the highest level of quality and reliability to its customers. Fairchild supplies components for the most demanding applications with guaranteed parametric limits spanning commercial, automotive,


    Original     		PDF

    Untitled

    Abstract: No abstract text available
    Text: V is h ay I ntertec h n o l o g y, I nc . I INNOVAT AND TEC O L OGY Vishay Sfernice N HN THIN FILM RESISTORS O 19 62-2012 Resistors - Aero, Mil and Space Qualified Thin Film Resistors, High Reliability Products Vishay Sfernice Products for Aeronautics/Military/Space AMS Applications


    Original     		PDF Failure4-9337-2726 VMN-SG2135-1204

    RFC1662

    Abstract: VC12 DSF15 concatenated and OC-3 and STM-1
    Text: DSF15 Product Brief DSF15 155 Mbps Data Service Framer Features The DSF15 is a highly integrated Data Service Framer device capable of mapping Ethernet traffic into OC-3/STM-1 SONET/SDH transport payloads. The DSF15 is equipped with 10/100 Ethernet and Gigabit Ethernet interfaces, and


    Original     		PDF DSF15 DSF15 G00207-04 RFC1662 VC12 concatenated and OC-3 and STM-1

    LM318

    Abstract: LM318 Op Amp IC LM318H DS007766 LM118H DS007766-11 LM118J LM318M LM318N8
    Text: LM118/LM218/LM318 Operational Amplifiers General Description The LM118 series are precision high speed operational amplifiers designed for applications requiring wide bandwidth and high slew rate. They feature a factor of ten increase in speed over general purpose devices without sacrificing DC


    Original     		PDF LM118/LM218/LM318 LM118 AN-79: LB-25: AN-227: AN-242: AN-71: LM4250 LM318 LM318 Op Amp IC LM318H DS007766 LM118H DS007766-11 LM118J LM318M LM318N8

    EPROM retention bake

    Abstract: mass flow meter evaluation kit
    Text: APPLICATION NOTE QUALITY AND RELIABILITY INFORMATION by the Micro Divisions INTRODUCTION We think that maintaining an optimal quality level is very important but we also believe that our customers contribute to the quality chain when they handle or program our MCU devices This


    Original     		PDF CHAINAN902/0299 EPROM retention bake mass flow meter evaluation kit

    intermediat

    Abstract: capacitor 2D EIA-198 KKE0065-1 KKE0141-U KKE0148-H KKE0282-3 KKE0291-2 KKE0362-U-E material composition of chip capacitors
    Text: Multilayer ceramic capacitors General technical information Date: October 2006 Data Sheet ã EPCOS AG 2006. Reproduction, publication and dissemination of this data sheet and the information contained therein without EPCOS’ prior express consent is prohibited.


    Original     		PDF 198-1-F, intermediat capacitor 2D EIA-198 KKE0065-1 KKE0141-U KKE0148-H KKE0282-3 KKE0291-2 KKE0362-U-E material composition of chip capacitors

    DSF250

    Abstract: RFC1662 galazar dsf250 G00156
    Text: DSF250 Product Brief DSF250 2.5 Gbps Data Service Framer Features The DSF250 is a highly integrated Data Service Framer device capable of mapping Datacom traffic into protected SONET/SDH transport payloads. The DSF250 is equipped with 10/100 Ethernet, Gigabit Ethernet and


    Original     		PDF DSF250 DSF250 OC-48/STM-16. G00156-07 RFC1662 galazar dsf250 G00156