Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR93XXXT3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR93XXXT3S
01-20DB)
DC-12
TP-8965.
MC0023.
|
PDF
|
HR93
Abstract: 1009945 DC-12 MIL-R-55342
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR93XXXT3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR93XXXT3S
01-20DB)
DC-12
MIL-STD-1686.
MIL-STD-130.
TP-8965.
755W002.
HR93
1009945
MIL-R-55342
|
PDF
|
HR93
Abstract: 1009935 DC-12 MIL-R-55342
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR93XXXT3 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR93XXXT3
01-20DB)
DC-12
MIL-STD-1686.
MIL-STD-130.
TP-8965.
755W002.
HR93
1009935
MIL-R-55342
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR93XXXT3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR93XXXT3S
01-20DB)
DC-12
MIL-STD-1686.
MIL-STD-130.
TP-8965.
MC0023.
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR93XXXT3 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR93XXXT3
01-20DB)
DC-12
TP-8965.
MC0023.
|
PDF
|