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    J-STD-020

    Abstract: JSTD-020 JSTD020 235c J-STD020
    Text: 01/25/2006 RELIABILITY REPORT FOR DS21Q50, Rev C1, 100 LQFP, 14x14x1.4mm Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292


    Original     		DS21Q50, 14x14x1 30C/60% J-STD-020 JSTD-020 JSTD020 235c J-STD020 PDF

    Eftec ra 308

    Abstract: Ablebond 84-1LMISR4 JM2500 wafer fab control plan MICRON 64T
    Text: Reliability Update Table of Contents Overview . 1 Organization of the Update . 1


    Original     		PDF

    N20X DIODE

    Abstract: A35355 TA8923 ta8872 ta8903 TA8782 ta7833 transistor 123 TA7811 ta8825
    Text: Reliability Update Table of Contents Overview . 1 Organization of the Update . 1


    Original     		100LPQFP 160LPQFP 28LSOIC N20X DIODE A35355 TA8923 ta8872 ta8903 TA8782 ta7833 transistor 123 TA7811 ta8825 PDF