Marking
Abstract: No abstract text available
Text: 111 CASE REFERENCE Fig. 1 A Fig. 2 B Fig. 3 C Fig. 4 Marking Marking Marking Marking Fig. 5 E Fig. 6 Marking Fig. 9 Fig. 10 M Fig. 11 N Fig. 18 K Fig. 15 Fig. 12 Fig. 16 P Marking S Marking L Marking O Fig. 19 H Marking Marking R Marking Fig. 8 Marking Marking
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KDV143F
Abstract: No abstract text available
Text: SEMICONDUCTOR KDV143F MARKING SPECIFICATION TFSC PACKAGE 1. Marking method Laser Marking 2. Marking Y No. 2007. 3. 12 Item Marking Description Device Mark Y KDV143F Revision No : 1 1/1
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KDV143F
KDV143F
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KDS114E
Abstract: No abstract text available
Text: SEMICONDUCTOR KDS114E MARKING SPECIFICATION ESC PACKAGE 1. Marking method Laser Marking 2. Marking UD No. 2000. 12. 27 Item Marking Description Device Mark UD KDS114E Revision No : 0 1/1
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KDS114E
KDS114E
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PG05FSUL2
Abstract: No abstract text available
Text: SEMICONDUCTOR PG05FSUL2 MARKING SPECIFICATION ULP-2 PACKAGE 1. Marking method Laser Marking 2. Marking No. 2008. 3. 12 Item Marking Description Device Mark 5P PG05FSUL2 Revision No : 0 1/1
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PG05FSUL2
PG05FSUL2
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KDS160F
Abstract: No abstract text available
Text: SEMICONDUCTOR KDS160F MARKING SPECIFICATION TFSC PACKAGE 1. Marking method Laser Marking 2. Marking 4 No. 2005. 12. 29 Item Marking Description Device Mark 4 KDS160F Revision No : 0 1/1
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KDS160F
KDS160F
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KDV239E
Abstract: No abstract text available
Text: SEMICONDUCTOR KDV239E MARKING SPECIFICATION ESC PACKAGE 1. Marking method Laser Marking 2. Marking UJ No. 2000. 12. 27 Item Marking Description Device Mark UJ KDV239E Revision No :0 1/1
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KDV239E
KDV239E
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KDV214E
Abstract: No abstract text available
Text: SEMICONDUCTOR KDV214E MARKING SPECIFICATION ESC PACKAGE 1. Marking method Laser Marking 2. Marking UO No. 2000. 12. 27 Item Marking Description Device Mark UO KDV214E Revision No :0 1/1
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KDV214E
KDV214E
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marking 12
Abstract: KDZ12EV KD* MARKING
Text: SEMICONDUCTOR KDZ12EV MARKING SPECIFICATION ESC PACKAGE 1. Marking method Laser Marking 2. Marking 12 No. 2000. 8. 8 Item Marking Description Device Mark 12 KDZ12EV Revision No :0 1/1
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KDZ12EV
marking 12
KDZ12EV
KD* MARKING
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KRC404V
Abstract: MARK ND ND marking
Text: SEMICONDUCTOR KRC404V MARKING SPECIFICATION VSM PACKAGE 1. Marking method Laser Marking 2. Marking ND No. 2002. 12. 31 Item Marking Description Device Mark ND KRC404V hFE Grade - - Revision No : 0 1/1
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KRC404V
KRC404V
MARK ND
ND marking
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MARKING P8
Abstract: KRA321E
Text: SEMICONDUCTOR KRA321E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking P8 No. 2000. 12. 27 Item Marking Description Device Mark P8 KRA321E hFE Grade - - Revision No : 0 1/1
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KRA321E
MARKING P8
KRA321E
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KRA322E
Abstract: No abstract text available
Text: SEMICONDUCTOR KRA322E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking P9 No. 2000. 12. 27 Item Marking Description Device Mark P9 KRA322E hFE Grade - - Revision No : 0 1/1
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KRA322E
KRA322E
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marking p2
Abstract: KRA316E P2 marking
Text: SEMICONDUCTOR KRA316E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking P2 No. 2000. 12. 27 Item Marking Description Device Mark P2 KRA316E hFE Grade - - Revision No : 0 1/1
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KRA316E
marking p2
KRA316E
P2 marking
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marking PK
Abstract: KRA310E
Text: SEMICONDUCTOR KRA310E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking PK No. 2000. 12. 27 Item Marking Description Device Mark PK KRA310E hFE Grade - - Revision No : 0 1/1
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KRA310E
marking PK
KRA310E
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KRA320E
Abstract: p7 marking marking p7
Text: SEMICONDUCTOR KRA320E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking P7 No. 2000. 12. 27 Item Marking Description Device Mark P7 KRA320E hFE Grade - - Revision No : 0 1/1
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KRA320E
KRA320E
p7 marking
marking p7
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MARKING BF
Abstract: KDS112E
Text: SEMICONDUCTOR KDS112E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking BF No. 2000. 12. 27 Item Marking Description Device Mark BF KDS112E hFE Grade - - Revision No : 0 1/1
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KDS112E
MARKING BF
KDS112E
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A2ND
Abstract: e1 marking JB MARKING
Text: SEMICONDUCTOR PF1015UDF12 MARKING SPECIFICATION UDFN-12 PACKAGE 1. Marking method Laser Marking 1 No. T3 0A 2. Marking 2 Item Marking Description Device Mark T3 PF1015UDF12 * Lot No. 0A 2007. 1st Week [0:1st Character, A:2nd Character] Note * Lot No. marking method
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PF1015UDF12
UDFN-12
A2ND
e1 marking
JB MARKING
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KDP620UL
Abstract: No abstract text available
Text: SEMICONDUCTOR KDP620UL MARKING SPECIFICATION ULP-12 PACKAGE 1. Marking method Laser Marking 1 No. P0 0A 2. Marking 2 Item Marking Description Device Mark P0 KDP620UL * Lot No. 0A 2007. 1st Week [0:1st Character, A:2nd Character] Note * Lot No. marking method
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KDP620UL
ULP-12
KDP620UL
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KDP621UL
Abstract: No abstract text available
Text: SEMICONDUCTOR KDP621UL MARKING SPECIFICATION ULP-12 PACKAGE 1. Marking method Laser Marking 1 No. P1 0A 2. Marking 2 Item Marking Description Device Mark P1 KDP621UL * Lot No. 0A 2007. 1st Week [0:1st Character, A:2nd Character] Note * Lot No. marking method
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ULP-12
KDP621UL
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6283K
Abstract: KIA6283K KIA6283 SSIP-12 KEC Lot No. Year
Text: SEMICONDUCTOR KIA6283K MARKING SPECIFICATION SSIP-12 PACKAGE 1. Marking method Laser Marking or Ink Marking 2. Marking KIA 6283K 816 No. Item 1 KEC KIA KEC ANALOG INTEGRATED CIRCUIT 2 Device Name 6283K KIA6283K 3 Lot No. 816 98.06.23 Revision No : Marking
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KIA6283K
SSIP-12
6283K
6283K
KIA6283K
KIA6283
KEC Lot No. Year
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KDP623UL
Abstract: No abstract text available
Text: SEMICONDUCTOR KDP623UL MARKING SPECIFICATION ULP-12 PACKAGE 1. Marking method Laser Marking 1 No. P3 0A 2. Marking 2 Item Marking Description Device Mark P3 KDP623UL * Lot No. 0A 2007. 1st Week [0:1st Character, A:2nd Character] Note * Lot No. marking method
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ULP-12
KDP623UL
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E2- marking
Abstract: marking T2
Text: SEMICONDUCTOR PF1010UDF12 MARKING SPECIFICATION UDFN-12 PACKAGE 1. Marking method Laser Marking 1 No. T2 0A 2. Marking 2 Item Marking Description Device Mark T2 PF1010UDF12 * Lot No. 0A 2007. 1st Week [0:1st Character, A:2nd Character] Note * Lot No. marking method
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PF1010UDF12
UDFN-12
E2- marking
marking T2
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KDP622UL
Abstract: marking p2
Text: SEMICONDUCTOR KDP622UL MARKING SPECIFICATION ULP-12 PACKAGE 1. Marking method Laser Marking 1 No. P2 0A 2. Marking 2 Item Marking Description Device Mark P2 KDP622UL * Lot No. 0A 2007. 1st Week [0:1st Character, A:2nd Character] Note * Lot No. marking method
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KDP622UL
ULP-12
KDP622UL
marking p2
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marking p4
Abstract: KRA317E
Text: SEMICONDUCTOR KRA317E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking P4 No. 2000. 12. 27 Item Marking Description Device Mark P4 KRA317E hFE Grade - - Revision No : 0 1/1
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KRA317E
marking p4
KRA317E
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marking B3
Abstract: KDS121E
Text: SEMICONDUCTOR KDS121E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking B3 No. 2000. 12. 27 Item Marking Description Device Mark B3 KDS121E hFE Grade - - Revision No : 0 1/1
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KDS121E
marking B3
KDS121E
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