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    PI74SSTV16857A

    Abstract: No abstract text available
    Text: Date: April 2004 Subject: SMIC Wafer Fab Facility Reliability Qualification - Update SMIC’s CMOS, 3.3 volt, 0.35-micron process was recently verified for acceptability to Pericom’s standard die level and process qualification requirements. A total of 120 units each from two separate


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    35-micron PI74SSTV16857V Q03004-3A PI74SSTV16857A 03270Y Q03004-4A PI74SSTV16857, 74SSTV116857D, PI74SSTV16857A PDF