SNW-EQ-611
Abstract: No abstract text available
Text: Philips Semiconductors Product specification Microwave Transistors General QUALITY necessary corrective action. Process steps are under statistical process control. Total Quality Management • Acceptance tests on finished products to verify conformance with the device specification. The test
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tda1000
Abstract: Germanium Diode aa112 BPW50 PCF-1105WP 74LS00A PCF1105 BZW70 9v1 zener diode circuits
Text: Philips Semiconductors Semiconductors for Telecom systems QUALITY General • acceptance tests on finished products to verify conformance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirements are
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PCF1105WP:
GMB74LS00A-DC:
74LS00A;
TDA1000P:
SAC2000:
tda1000
Germanium Diode aa112
BPW50
PCF-1105WP
74LS00A
PCF1105
BZW70
9v1 zener diode circuits
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h0 sod123
Abstract: Transistor SMD SOT363 SC70 SOT353 hf Device h0 sod123 GaAs tunnel diode gFE smd diode SOD80 footprint sot23 footprint SOT346 ZENER thyristor handbook
Text: Philips Semiconductors RF Wideband Transistors General section • Acceptance tests on finished products to verify conformance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirements are
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MLB049
h0 sod123
Transistor SMD SOT363 SC70
SOT353 hf
Device h0 sod123
GaAs tunnel diode
gFE smd diode
SOD80 footprint
sot23 footprint
SOT346 ZENER
thyristor handbook
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Untitled
Abstract: No abstract text available
Text: Philips Sem iconductors Small-signal Transistors General • Acceptance tests on finished products to verify conform ance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirem ents are
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apqp MANUAL
Abstract: quality acceptance plan wafer fab control plan FORD apqp manual Ford in-process quality ford ppap delco ic MATERIAL CONTROL PROCEDURE PPAP MANUAL Ford Part Number
Text: Status of Document is:RELEASED Effective from: 07-NOV-1995 17:36:32 to Date Printed: 09/03/97 6:30 AM 1.0 Controlled Document Purpose The purpose of this document is to define the procedure for implementing Control Plans for integrated circuits designed for the automotive customers Chrysler, Ford or General
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07-NOV-1995
QOP-SMV-002
QOP-SMV-004
95QP004
apqp MANUAL
quality acceptance plan
wafer fab control plan
FORD apqp manual
Ford in-process quality
ford ppap
delco ic
MATERIAL CONTROL PROCEDURE
PPAP MANUAL
Ford Part Number
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intersil DATE CODE MARKING
Abstract: pin diagram details of CD4015 y2010 R4573 B TA3842 wafer fab control plan TA388* transistor ESD test plan ta5142 R4573
Text: Status of Document is: RELEASED Effective from: 07-AUG-2000 09:48:23 to Date Printed: 07-Aug-2000 10:33:38 Controlled Document QML QUALITY MANAGEMENT PLAN Title: QML QUALITY MANAGEMENT PLAN Specification Type: DOCS Specification Number :999015 Issue :24 Page :1 of 100
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07-AUG-2000
28-SEP-1995
03-NOV-1995
21-SEP-1995
28-SEP-1995
intersil DATE CODE MARKING
pin diagram details of CD4015
y2010
R4573 B
TA3842
wafer fab control plan
TA388* transistor
ESD test plan
ta5142
R4573
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quality acceptance plan
Abstract: JESD22-102 JESD22-105 generic failure rate electronic device JESD22-A103 JESD22-A108 JESD22-A101 JESD22-A102 Fairchild wafer fab processes outgoing quality
Text: QUALITY Reliability Qualification Program Fairchild Semiconductor is committed to delivering the highest level of quality and reliability to its customers. Fairchild supplies components for the most demanding applications with guaranteed parametric limits spanning commercial, automotive,
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BS0001
Abstract: BS-0001 INCOMING RAW MATERIAL INSPECTION method centrifuge
Text: m o \ Reliability Program ELECTRONIC DESIGNS IN C . Quality Control Tests and Procedures Electronic Designs, Inc.'s continuing effort to be a leader in providing top quality products has lead us to com plete our m ission to become IS 09001 certified. The certification is the most comprehensive quality
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Hours/80
C/150
EP-00008
TP-00002
QP-00062
TP-00006
EP-00004,
EP-00005
QP-00062
BS0001
BS-0001
INCOMING RAW MATERIAL INSPECTION method
centrifuge
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INCOMING RAW MATERIAL INSPECTION form
Abstract: IC 34992 ucl 11
Text: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to monitor the integrity of its devices. All industry' standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect
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Untitled
Abstract: No abstract text available
Text: 5. Quality Assurance and Reliability So n y's Policy of Quality Assurance The Sony sem iconductor em bodies The other point is a source m anagem ent system com bined with the concept of thorough quality design. W ith this system, higher quality products can be steadily
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kd 2060 transistor
Abstract: saia factory 124
Text: 60 years of Know-How CATALOG 1 rs-485 OFFER of measuring instruments and Electronics Manufacturing Services WWW.LUMEL.COM.PL To meet the expectation of our customers we continuously take care of improving the quality management system. It takes place at every activity level, from the identification of the customer’s needs, through the production
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rs-485
kd 2060 transistor
saia factory 124
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NEC Ga FET marking L
Abstract: tamagawa gaas fet marking B mmic amplifier marking code N5 NE272 FET marking code .N5 ne29200 NE23383B NE292 gaas fet marking a
Text: GET-30749, Revision C NEC NEC Corporation Tamagawa Plant 1753,Shimonumabe, Nakahara-lcu, Kawasaki, Kanagawa, 211-8666 Specification Control Drawing o f Grade L GaAs Devices fo r Satellite Applications Prepared on: September 28,2000 Prepared by: Masahito Kushima
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GET-30749,
GET-30749
NE29200
NE674
uPG501B
uPG501P
uPG503B
uPG503P
uPG506B
NEC Ga FET marking L
tamagawa
gaas fet marking B
mmic amplifier marking code N5
NE272
FET marking code .N5
ne29200
NE23383B
NE292
gaas fet marking a
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FTG-12
Abstract: INCOMING RAW MATERIAL FILM INSPECTION procedure ADE-6 Sample form for INCOMING Inspection of RAW MATERIAL mosfet 1500v MTBF UCL 2003 INCOMING RAW MATERIAL INSPECTION method
Text: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to m onitor the integrity o f its devices. All industry standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect
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Untitled
Abstract: No abstract text available
Text: •AMI Quality Program AMERICAN MICROSYSTEMS, INC. General Information August 1996 Introduction QA Operations checks all phases of the manufacturing process, including incoming materials, to insure adherence to specifications and procedures through the use of audits, inspections, and other monitoring
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MIL-I38535,
MIL-STD-883,
MIL-Q-9858
MIL-M-38510,
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MIL-PRF38535
Abstract: RH119
Text: SPEC NO. 05-08-5145 REV. E RH119 HIGH PERFORMANCE DUAL COMPARATOR DICE REVISION RECORD REV DESCRIPTION DATE INITIAL RELEASE A PAGE 9, FIGURE 4, CHANGED θJA 09/29/99 B PAGE 3, PARAGRAPH 3. 8 CHANGED VERBIAGE ADDED “HEREIN “ AFTER TABLE 1. 01/04/00 PAGE 4, PARAGRAPH 5. 0 CHANGED VERBIAGE ADDED “HEREIN” AFTER TABLE 3.
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RH119
MIL-PRF38535
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5962-8867001LA cypress
Abstract: INCOMING RAW MATERIAL INSPECTION procedure PALC22V10-25PI 5962-8867001LA Mil-Std-883 Wire Bond Pull Method 2011 cypress part marking CY7C122 PALC22V10 visual inspection of raw materials MIL-STD-883 Method 2010
Text: Quality, Reliability, and Process Flows Corporate Views on Quality and Reliability Product Testing Categories Cypress believes in product excellence. Excellence can only be defined by how the users perceive both our product quality and reliability. If you, the user, are not satisfied with every
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MIL-STD-750 METHOD 2036 CONDITION E
Abstract: pro-electron
Text: Quality and Reliability Assurance Quality and Reliability Assurance QUALITY Two programs are utilized by Fairchild's DPST Group to ensure product reliability: 1. Reliability Qualification Program - for new products and changes in manufacturing processes, locations or materials.
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AMP Spec 109-35
Abstract: No abstract text available
Text: PRODUCT SPECIFICATION 1. SCOPE 1.1. Content This specification covers the performance, tests and quality requirements for the AMP* Tandem Spring shunt connector. This connector is a separable electrical connection device for mating with two .025 square posts. When used in normal
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MIL-PRF38535
Abstract: RH119 TM1019
Text: SPEC NO. 05-08-5145 REV. G RH119 HIGH PERFORMANCE DUAL COMPARATOR DICE REVISION RECORD REV DESCRIPTION DATE INITIAL RELEASE 06/14/99 A PAGE 9, FIGURE 4, CHANGED θJA 09/29/99 B PAGE 3, PARAGRAPH 3. 8 CHANGED VERBIAGE ADDED “HEREIN “ AFTER TABLE 1. 01/04/00
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RH119
MIL-PRF38535
TM1019
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R4573
Abstract: docs
Text: Status of Document is:RELEASED Effective from: 02-JUN-1997 08:18:36 to Date Printed: 06/09/97 6:51 AM Controlled Document APPENDIX C QML SHIP AHEAD OF QUALIFICATION TESTING QCI/TCI to MEET CUSTOMER REQUIREMENTS. Title: QML QUALITY MANAGEMENT PLAN Specification Type: DOCS
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02-JUN-1997
R4573
docs
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res chip TF 2w F 2512
Abstract: CHP1 viscometer data sheet 51R0 R200 51r200 CHP1 irc chp1/2-100-1001
Text: Power Resistors-Application Specific Surface Mount Resistors For Power Applications A Subsidiary of TT electronics PLC IRC Wirewound and Film Division CONTENTS 1.0 INTRODUCTION 1.1 1.2 Product History Product Description 2.0 PRODUCT MANUFACTURE, STRUCTURE, AND QUALITY CONTROL
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MP-3610-37-0500
3610-34data/correct
0100C
res chip TF 2w F 2512
CHP1
viscometer data sheet
51R0
R200
51r200
CHP1 irc
chp1/2-100-1001
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Rod Resistors
Abstract: irc chp1 CHP Series ford q1 QC-3610-12-0400
Text: IRC CHP Series Handbook TT electronics IRC - Wirewound & Film Technologies Division 736 Greenway Road PO Box 1860 Boone, NC 28607 USA 1-828-264-8861 March 2003 CONTENTS 1.0 INTRODUCTION 1.1 1.2 Product History Product Description 2.0 PRODUCT MANUFACTURE, STRUCTURE, AND OUALITY CONTROL
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3610-340100C
Rod Resistors
irc chp1
CHP Series
ford q1
QC-3610-12-0400
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EIA-364-06
Abstract: ASTM-D-4565 QQ-S-571 ASTM-D-4566 BUS-03-601 EIA-364-18 BERG STRIP EIA-364-29 P1394 74351
Text: PRODUCT SPECIFICATION GES-12-021 1 19 D P1394 Product Specification R. MacMullin 1.0 OBJECTIVE This specification defines the performance, test, quality and reliability requirements of the P1394 High Performance Serial Bus 2.0 SCOPE This specification is applicable to the termination characteristics of the P1394 family of products
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GES-12-021
P1394
P1394
V71594
V80289
V81787
V90839
EIA-364-06
ASTM-D-4565
QQ-S-571
ASTM-D-4566
BUS-03-601
EIA-364-18
BERG STRIP
EIA-364-29
74351
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Untitled
Abstract: No abstract text available
Text: PRODUCT SPECIFICATION 1. SCOPE 1.1. Content This specification covers performance, tests and quality requirements for AMP 3100 series rotary switch. These switches are manually operated rotary devices designed for through panel mounting. Standard switch termination is an AMP "FM
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