RELIABILITY DATA ANALYSIS Search Results

RELIABILITY DATA ANALYSIS Result Highlights (5)

Part	Manufacturer	Description	Download
NFMJMPC226R0G3D	Murata Manufacturing Co Ltd	Data Line Filter,
NFM15PC755R0G3D	Murata Manufacturing Co Ltd	Feed Through Capacitor,
NFM15PC435R0G3D	Murata Manufacturing Co Ltd	Feed Through Capacitor,
NFM15PC915R0G3D	Murata Manufacturing Co Ltd	Feed Through Capacitor,
MP-52RJ11SNNE-100	Amphenol Cables on Demand	Amphenol MP-52RJ11SNNE-100 Shielded CAT5e 2-Pair RJ11 Data Cable [AT&T U-Verse & Verizon FiOS Data Cable] - CAT5e PBX Patch Cable with 6P6C RJ11 Connectors (Straight-Thru) 100ft	Datasheet

RELIABILITY DATA ANALYSIS Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
2391 Abstract: 603EV Text: Tuesday, July 24, 2001 603ev Reliability Data 603ev Reliability & Qualification Data This is the reliability & qualification data for the PowerPC 603ev microprocessor. The FIT and MTBF graphs for this device are located at the bottom of this page. Stress Results	Original	603ev /-200mA, C/150 1000vents C/100 21x21mm C/125 2391	PDF
106 10k 804 Abstract: 106F 213B Text: CTS ClearONE Terminator Reliability Test Data RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN &	Original		PDF
4932 Abstract: 7086 generic failure rate D2863 JESD47 M2003 M2004 JESD-47 HTGB Text: Reliability Information Vishay Siliconix Reliability at Vishay Siliconix This document provides a general description of Vishay Siliconix’s reliability program. The reliability data for specific products is available from the information page associated with each part. The general reliability description provided below and the reliability	Original	17-Nov-05 UL-94 D2863 J-STD-020C) 4932 7086 generic failure rate JESD47 M2003 M2004 JESD-47 HTGB	PDF
max785cai Abstract: MAX6809 MAX232CPE MAX232CPE application sheet MAX232ACPE MAX232AEPE MAX691ACPE T 9722 MAX232ECPE MAX233 application notes Text: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1	Original		PDF
max785cai Abstract: MAX232A SO-16 MAX232CPE application sheet MAX232CPE MAX232AEPE MAX785 MAX232ACPE MAX241CWI LH101 MAX724CCK Text: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1	Original		PDF
MAX785 Abstract: st 9635 DG302 to220 MAX232CPE MAX232 integrated chips IC 9637 MAX333 equivalent max232 MTBF calculation MAX232 mtbf st 9548 Text: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard	Original		PDF
DG302 to220 Abstract: MAX233 application notes zener 9514 MAX249 MAX238 9545 MAX232CPE application sheet max809 ICM7218AIPI MAX232 application notes Text: November 1, 1996 RR-1J Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1995. It is separated into seven fabrication processes: 1 Standard	Original		PDF
DG302 to220 Abstract: MAX724 equivalent 9532 zener MAX233 application notes MAX7219 equivalent MAX232CPE application sheet MAX238 MX7226 MAX249 MAX485 application notes Text: November 1, 1996 RR-1J Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1995. It is separated into seven fabrication processes: 1 Standard	Original		PDF
max785 Abstract: DG302 to220 DG301 to220 st 9635 st 9548 MAX232 integrated chips max232 MTBF calculation MAX232 mtbf MAX333 equivalent MAX232ACPE Text: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard	Original		PDF
MAX202, MAX232 Abstract: LTC902 icl8069 equivalent MAX8212 equivalent MAX705 equivalent 7912 TO3 PACKAGE MAX832 MX7543 Ic 9430 MAX232 Text: May 1, 1995 RR-1I Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed in 1994. It is separated into six fabrication processes: 1	Original		PDF
ST 9427 Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427 Text: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and	Original	12GHz 27GHz ST 9427 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427	PDF
MAX7845 Abstract: MAX232 MAX232 mtbf mar 9109 MAX333 equivalent MAX9690 equivalent scr 9117 maxim 9114 max232 specification MAX252 8 pin Text: RR-1G Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from 1990 to 1992. It is separated into four groups: Metal Gate	Original	X10-9 MAX7845 MAX232 MAX232 mtbf mar 9109 MAX333 equivalent MAX9690 equivalent scr 9117 maxim 9114 max232 specification MAX252 8 pin	PDF
ic 9033 Abstract: MAX232 MAX333 equivalent max232 MTBF calculation MAX232 mtbf MAX7845 mar 9109 MAX9690 equivalent maxim 9114 MAX690CPA Text: RR-1G Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from 1990 to 1992. It is separated into four groups: Metal Gate	Original	X10-9 ic 9033 MAX232 MAX333 equivalent max232 MTBF calculation MAX232 mtbf MAX7845 mar 9109 MAX9690 equivalent maxim 9114 MAX690CPA	PDF
XC2018 PC84 Abstract: xc4300 XC4020 HQFP208 HQFP34 XC1765D XC3342 XC4305 XC4005E PHYSICAL XC500 356E-09 Text: The Reliability Data Program Expanded Version April 1, 1998 Cover TABLE OF CONTENTS Introduction .3 The Reliability Program. .3	Original	PLCC-20, XC2018 PC84 xc4300 XC4020 HQFP208 HQFP34 XC1765D XC3342 XC4305 XC4005E PHYSICAL XC500 356E-09	PDF

MAX232 Abstract: max232 specification MAX252 8 pin MAX9690 equivalent MAX584 max-232 38544 LTC902 max232 MTBF calculation MAX9687 Text: December 1, 1994 RR-1H Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from January 1990 to January 1994. It is separated into six	Original		PDF
121C-2 Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478 Text: The Reliability Data Program Expanded Version Jan. 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4	Original	XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA 121C-2 XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478	PDF
XC95XXXL Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices Text: The Reliability Data Program Expanded Version July 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4	Original	XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA XC95XXXL XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices	PDF
MAX232 Abstract: MAX1074 LTC902 MAX252 8 pin max232 MTBF calculation max232 specification MAX9687 38544 MAX9690 equivalent analog devices dg508 die Text: December 1, 1994 RR-1H Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from January 1990 to January 1994. It is separated into six	Original		PDF
68hc26 Abstract: 68HC05C4 68hc705p9 68HC05B6 JPC3400 68hc805b6 68705r3 68HC05C12 68HC705B5 68HC68SE Text: CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION . 1-1 RELIABILITY DATA BY TECHNOLOGY. 2-1	Original		PDF
A9701 Abstract: MIL-PRF38535 XC1700D XC7000 XC9500 xc4310 XC3390A vqfp100 package XC95XX XCS40 failure Text: The Reliability Data Program Expanded Version Jan. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4	Original	PLCC-20, A9701 MIL-PRF38535 XC1700D XC7000 XC9500 xc4310 XC3390A vqfp100 package XC95XX XCS40 failure	PDF
XcxxX Abstract: vqfp100 package PQFP160 XILINX mp8000ch4 marking 611 016 soic-8 XCS40 failure Xcs17 xc95144 XC95144 equivalent Text: The Reliability Data Program Expanded Version April. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4	Original	PLCC-20, XcxxX vqfp100 package PQFP160 XILINX mp8000ch4 marking 611 016 soic-8 XCS40 failure Xcs17 xc95144 XC95144 equivalent	PDF
D87C257 Abstract: ic 41315 D27256 US94V D2732A intel 2708 eprom intel 4308 intel EPROM RR-35 D27C256 Text: in ter RELIABILITY REPORT RR-35 November 1990 EPROM RELIABILITY DATA SUMMARY Order Number: 210473-007 5-287 5 RR-35 INTEL EPROM RELIABILITY DATA SUMMARY CONTENTS page The Importance of Reliability. 5-289 EPROM Reliability Data Summary . 5-289	OCR Scan	RR-35 D2732A D2764A D27128A D27256 D27C256 D87C257 P2764A. 27C256 D87C257 ic 41315 D27256 US94V D2732A intel 2708 eprom intel 4308 intel EPROM RR-35 D27C256	PDF
Sumitomo CRM 1033B Abstract: sumitomo 1033B CRM1033B MOTOROLA POWER TRANSISTOR lc 945 sumitomo crm-1033B 8361J Text: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Reliability Information Motorola Reliability and Quality Assurance Reliability Motorola has a long standing reputation for manufacturing products of excellent Quality and Reliability since the introduction of the first car	OCR Scan	BR1339 Sumitomo CRM 1033B sumitomo 1033B CRM1033B MOTOROLA POWER TRANSISTOR lc 945 sumitomo crm-1033B 8361J	PDF
P21256 Abstract: p21464 411K intel 21256 p21010 Text: intei RELIABILITY REPORT RR-62 September 1989 Dynamic RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240543-001 3-158 DRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 OVERVIEW . 3-160	OCR Scan	RR-62 P21256 p21464 411K intel 21256 p21010	PDF

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RELIABILITY DATA ANALYSIS Search Results

RELIABILITY DATA ANALYSIS Result Highlights (5)

RELIABILITY DATA ANALYSIS Datasheets Context Search

2391

106 10k 804

4932

max785cai

max785cai

MAX785

DG302 to220

DG302 to220

max785

MAX202, MAX232

ST 9427

MAX7845

ic 9033

XC2018 PC84

MAX232

121C-2

XC95XXXL

MAX232

68hc26

A9701

XcxxX

D87C257

Sumitomo CRM 1033B

P21256