SEMICONDUCTOR QUALITY ASSURANCE OFFICE ORGANIZATION Search Results
SEMICONDUCTOR QUALITY ASSURANCE OFFICE ORGANIZATION Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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MHM411-21 | Murata Manufacturing Co Ltd | Ionizer Module, 100-120VAC-input, Negative Ion |
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SCL3400-D01-1 | Murata Manufacturing Co Ltd | 2-axis (XY) digital inclinometer |
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D1U74T-W-1600-12-HB4AC | Murata Manufacturing Co Ltd | AC/DC 1600W, Titanium Efficiency, 74 MM , 12V, 12VSB, Inlet C20, Airflow Back to Front, RoHs |
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SCC433T-K03-004 | Murata Manufacturing Co Ltd | 2-Axis Gyro, 3-axis Accelerometer combination sensor |
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MRMS591P | Murata Manufacturing Co Ltd | Magnetic Sensor |
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SEMICONDUCTOR QUALITY ASSURANCE OFFICE ORGANIZATION Datasheets Context Search
Catalog Datasheet | MFG & Type | Document Tags | |
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JESD22-A108-A
Abstract: JESD22-A104-A JESD22*108 EIA-671 JEDS22-C101-A doc-70 ISO14000 J-STD-035 8110014 Distributors and Sales Partners
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MIL-STD-883, MIL-STD-883E, J-STD-035 JESD22-A108-A JESD22-A104-A JESD22*108 EIA-671 JEDS22-C101-A doc-70 ISO14000 J-STD-035 8110014 Distributors and Sales Partners | |
IEC 68-2-63
Abstract: transistors Si 6822 MIL-STD-781 transistors 6822 si MIL-STD-785 MIL-STD-721 The Japanese Transistor Manual 1981 IEC 68-2-28 AND 7411 NATIONAL SEMICONDUCTOR MARKING BM
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quality assurance for semiconductor devices
Abstract: in-process quality inspections ISO9002 BS5750 semiconductor quality assurance office organization Seminar national semiconductor
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hp 4514
Abstract: mitsubishi series 740 software "7790" Mitsubishi mitsubishi series 740 assembler S1912 8 pin SMD ic 4570 4570 8 pin ic 4500 microcomputer M16C/80 data sheet 8 pin ic 4570
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PC4701M PC4701M. hp 4514 mitsubishi series 740 software "7790" Mitsubishi mitsubishi series 740 assembler S1912 8 pin SMD ic 4570 4570 8 pin ic 4500 microcomputer M16C/80 data sheet 8 pin ic 4570 | |
MH8S64AQFC -7
Abstract: M5M51008CFP-70HI sop-32 pin Shipping Trays S1912 M5M5V108DFP-70HI jeida dram 88 pin M5M465165 MH8S64AQFC-6 MH8S64DBKG-6 PC-100
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semiconductor quality assurance office organization
Abstract: 750H OKI CMOS
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toshiba lot traceability
Abstract: toshiba control code toshiba traceability toshiba trace code Diversified Engineering and Manufacturing semiconductor quality assurance office organization failure report micron Standard Bar Code Label Wuxi Automation Engineering toshiba weekly code two digits marking
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st-100sx
Abstract: Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260
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2SK1544 st-100sx Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260 | |
D43256AC
Abstract: d431000acz shockley diode Ultrasonic humidifier circuit shockley diode application INCOMING RAW MATERIAL INSPECTION checklist d431000agw D43256AGU D431000AGZ D43256AC 85 L
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AN-RQC-REP013V20 D43256AC d431000acz shockley diode Ultrasonic humidifier circuit shockley diode application INCOMING RAW MATERIAL INSPECTION checklist d431000agw D43256AGU D431000AGZ D43256AC 85 L | |
D43256AC
Abstract: D431000ACZ D431000AGZ shockley diode D431000AGW D43256AGU UPD7752 UPD7810 d4464 uPD8243
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AN-RQC-REP013V20 D43256AC D431000ACZ D431000AGZ shockley diode D431000AGW D43256AGU UPD7752 UPD7810 d4464 uPD8243 | |
ST-100SX
Abstract: MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater
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2SK1544 ST-100SX MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater | |
EIA-583
Abstract: manson 925 LH1526 iso 900x TS16946 Coffin-Manson exponent
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22-Mar-04 EIA-583 manson 925 LH1526 iso 900x TS16946 Coffin-Manson exponent | |
EN61340-5-1
Abstract: EIA-583 EN-61340-5-1 manson 925 manson INCOMING RAW MATERIAL INSPECTION format INCOMING RAW MATERIAL INSPECTION procedure "RH-5" Vishay INCOMING RAW MATERIAL INSPECTION report format SiS 900
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26-Aug-05 EN61340-5-1 EIA-583 EN-61340-5-1 manson 925 manson INCOMING RAW MATERIAL INSPECTION format INCOMING RAW MATERIAL INSPECTION procedure "RH-5" Vishay INCOMING RAW MATERIAL INSPECTION report format SiS 900 | |
82501
Abstract: No abstract text available
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26-Aug-05 82501 | |
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EIA-583
Abstract: TS16946 manson Vishay quality iso certificate k385 automotive thyristor IPC-SM-786 marking CDF Coffin-Manson exponent
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11-Sep-03 EIA-583 TS16946 manson Vishay quality iso certificate k385 automotive thyristor IPC-SM-786 marking CDF Coffin-Manson exponent | |
7 pin dips smps power control ic
Abstract: jfet folded cascode foundry INCOMING MATERIAL INSPECTION procedure Use High-Voltage Op Amps to Drive Power MOSFETs, bilateral zener diode marking MPD8021 transistors diodes ics cross reference micrel 1993 outgoing raw material inspection procedure MIC8021-0002
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80098
Abstract: manson 925 EIA-583 JEP 113 Coffin-Manson exponent Coffin-Manson Equation IPC-SM-786
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26-May-04 80098 manson 925 EIA-583 JEP 113 Coffin-Manson exponent Coffin-Manson Equation IPC-SM-786 | |
obtained
Abstract: ROHM Electronics
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Quality Information
Abstract: 80119 manson optocoupler MTBF calculation af118 manson 925
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12-Mar-08 failures/109 Quality Information 80119 manson optocoupler MTBF calculation af118 manson 925 | |
NEC semiconductor
Abstract: NEC Telephones
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PD4632312-X PD4632312-X PD4632312-BX PD4632312-CX PD4632312-BEX PD4632312-CEX 56-ball 2002/Printed M16005EU1V0PB00 NEC semiconductor NEC Telephones | |
induction cooker fault finding diagrams
Abstract: induction cooker schematic diagram EDS SHIELD DOMESTIC GAS DETECTOR schematic diagram induction cooker 3 gun sound generator UM 3562 NEC plasma tv schematic diagram ultrasonic flaw detector LS 2027 Final Audio LS 2027 audio Ultrasonic humidifier circuit
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C12769EJ2V0IF induction cooker fault finding diagrams induction cooker schematic diagram EDS SHIELD DOMESTIC GAS DETECTOR schematic diagram induction cooker 3 gun sound generator UM 3562 NEC plasma tv schematic diagram ultrasonic flaw detector LS 2027 Final Audio LS 2027 audio Ultrasonic humidifier circuit | |
Untitled
Abstract: No abstract text available
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18-Jul-13 | |
NEC semiconductor
Abstract: NEC stacked MCP MC-242442 MC-242443 MC-242444 MC-242452 MC-242453 MC-242454 semiconductor quality assurance office organization
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MC-2424xx MC-2424xx MC-242442: MC-242452: MC-242443: MC-242453: MC-242444: MC-242454: 77xpressly 2002/Printed NEC semiconductor NEC stacked MCP MC-242442 MC-242443 MC-242444 MC-242452 MC-242453 MC-242454 semiconductor quality assurance office organization | |
INCOMING RAW MATERIAL INSPECTION format
Abstract: signetics handbook
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100th INCOMING RAW MATERIAL INSPECTION format signetics handbook |