racal 6104
Abstract: mobile fault & repair GSM/6104 power systems analysis, control and fault finding nokia 206 lcd racal gpib Racal Instruments BS 2G 210 PCMCIA SRAM Card EN50082-1
Text: Cellular Parametric Test Racal Instruments Wireless Solutions 6104 - Digital Radio Test Set • Easy to use, fully integrated test set optimized for maintenance and servicing of GSM850, GSM900, GSM1800 and GSM1900 mobiles • GPRS single slot receiver BLER
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GSM850,
GSM900,
GSM1800
GSM1900
racal 6104
mobile fault & repair
GSM/6104
power systems analysis, control and fault finding
nokia 206 lcd
racal gpib
Racal Instruments
BS 2G 210
PCMCIA SRAM Card
EN50082-1
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racal 6113
Abstract: Racal Instruments 6113 6113G racal gpib Racal Instruments GSm Based Automation
Text: egprs.qxd 07/Jun/2005 13:15 Page 1 Protocol Test Racal Instruments Wireless Solutions 6113 AIME Base Station Test • GPRS BTS Air Interface Monitor/MS Emulator for protocol analysis • Applications in R & D, test, evaluation and support • Protocol regression testing and fault finding
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07/Jun/2005
racal 6113
Racal Instruments 6113
6113G
racal gpib
Racal Instruments
GSm Based Automation
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instrumentation projects
Abstract: No abstract text available
Text: NATIONAL INSTRUMENTS The Software is the Instrument Application Note 080 ® ® Creating Reusable Test Code for LabVIEW , Visual Basic, ® and C/C+ with LabWindows /CVI 4.0 J. Pasquarette Introduction Test and measurement system developers are faced with many challenges in developing test systems. For some
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TL175E
Abstract: EN61010-031
Text: Instruction Sheet TL175 TwistGuard Test Leads TP175 TwistGuard™ Test Probes Shroud drops ●● TL175E includes removable 4 mm lantern tips for versatility. ●● Compatible with all instruments that accept standard 4 mm shrouded banana plugs. ●● Recommended for use with Fluke modular test leads like the TL224 or with
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TL175E
TL224
TP175)
EN61010-031.
EN61010-031
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TL175
Abstract: EN61010-031 TL175E
Text: New Fluke TL175 TwistGuard Test Leads Twist. Test. TL175 TwistGuard™ Test Leads offer: • Patented TwistGuard™ extendable tip shroud that meets new electrical safety requirements to reduce tip exposure while providing the versatility needed for most
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TL175
-36-FLUKE
3860288B
EN61010-031
TL175E
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Boundary Scan Logic
Abstract: LVT8980
Text: Industry’s First 3.3-Volt IEEE 1149.1 Boundary Scan Test Bus Controller Simplifies Embedded Test DALLAS Oct. 21, 1996 - The industry’s first 3.3V IEEE 1149.1 (JTAG) boundary scan embedded test bus controller (eTBC) is now available in sample quantities from Texas
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LVT8980
Boundary Scan Logic
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Untitled
Abstract: No abstract text available
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT244
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V5050
Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT8244A
SN54BCT8244A
17customer
V5050
BCT244
F244
SN54BCT8244A
SN74BCT8244A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and
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SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT244
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Untitled
Abstract: No abstract text available
Text: ATE 4200 series Instrumentation Access Card Provides a high quality path between the unit under test and external instruments • 50 Ω access to unit under test • Co-axial connection to GPIB instruments • Interface rack mounted • 26 way general purpose connector
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bct8240a
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
SNJ54BCT8240AFK
5962View
9174601Q3A
SNJ54BCT8240AJT
9174601QLA
bct8240a
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Untitled
Abstract: No abstract text available
Text: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL DĆTYPE LATCHES SCBS471 − JUNE 1990 − REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and
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SN74BCT8373
SCBS471
SN74F373
SN74BCT373
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Untitled
Abstract: No abstract text available
Text: SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture
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SN74ABT18646
18-BIT
SCBS131A
P1149
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Untitled
Abstract: No abstract text available
Text: Wireless 3550 Touch-Screen Radio Test System The Complete Portable, On Site Radio Communication Test System for Analog and Digital Communication Systems The 3550. The first truly portable touch-screen radio communication test system. The 3550 takes radio and repeater site testing to the next level with a
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3550R)
Batt02
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J2/N2262A
Abstract: No abstract text available
Text: AN700 M ANUFACTURING TEST GUIDELINES FOR THE EMBER EM250, EM260, AND EM35X Formerly document 120-5016-000 Most customers have standard product manufacturing test flows, but some do not incorporate RF testing. This document details the different options for integrating RF testing and characterization into your standard test flows.
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AN700
EM250,
EM260,
EM35X
EM35x
J2/N2262A
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HP4284A
Abstract: No abstract text available
Text: XFMRS, Inc. XFMRS P/N : XFEB20120MOO-1A DIMENSION: m/m V, B 02.O±O2 12ÌQ2 D 05+03 0.9dh0.2 F H % M N ELECTRICAL REQUIREMENTS 60 Ohms±25% 0.100 Ohms Max Idc 1000mA Max TEST FREQ. TEST FREQ. 100 TEST INSTRUMENTS O HP 34401A MULTIMETER MHz O HP 4195 NETWORKS/SPECTRUM
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XFEB20120MQ0-1A
1000mA
MIL-STD-202G,
UL94V-0
El51556
102mm)
4401A
4285ALCR
HP4284A
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tqfp 64 socket
Abstract: tqfp 32 socket TQFP 100 pin Socket D1834 tQFP pitch
Text: Model 6150 100 Pin TQFP Test Clip 0.50 mm Lead Pitch Pomona These new, compact TQFP test clips provide the user with an easy means to connect test instruments to the fine pitch plastic TQFP and SQFP chip leads. • ■ ■ ■ Connects to high density plastic TQFP or SQFP surface
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D6150
tqfp 64 socket
tqfp 32 socket
TQFP 100 pin Socket
D1834
tQFP pitch
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HP4284A
Abstract: 4291A HP-4338A
Text: XFMRS, I n c . S P E C IF IC A T IO N XFMRS P / N : DIMENSION : m /m FOR X F EB321611 - 2 6 0 - 1 .5A u- A - H o i l V * 3 ELECTRICAL 1 ( TEST FREQ. 100 MHz TEST FREQ. MHz SRF TEST FREQ. MHz Rdc 0.03 OHMS MAX TEST FREQ. MHz Idc 1500mA TEST FREQ. MHz
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XFEB321611
1500mA
4401A
HP4284A
4291A
HP-4338A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E - FEBRUARY 1990 - REVISED DECEMBER 1996 • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits • Functionally Equivalent to ’F240 and
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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T10222-08373
Abstract: No abstract text available
Text: SN54BCT8373, SN74BCT8373 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES T10222—08373 JUNE 1990 Members of Texas Instruments SCOPE Family of Testability Products SNS4BCT8373 . . . JT PACKAGE SN74BCT8373 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits
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SN54BCT8373,
SN74BCT8373
T10222--08373
SNS4BCT8373
SN74BCT8373
SN54/74F373
SN54/74BCT373
T10222-08373
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SN54BCT8244A
Abstract: SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal
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SN54BCT8244A,
SN74BCT8244A
SCBS042D
SN54/74F244
SN54/74BCT244
752S5
SN54BCT8244A
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act8990
Abstract: SN54ACT8990 SN74ACT8990 sn74act8890
Text: SN54ACT8990, SN74ACT8990 TEST BUS CONTROLLERS SC AS190B - JUN E 1990 - REVISED A UG UST 1994 • Members of the Texas Instruments SCOPE Family of Testability Products * Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture
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SCAS190B
SN54ACT8990,
SN74ACT8990
44-Pin
68-Pin
act8990
SN54ACT8990
SN74ACT8990
sn74act8890
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TTL 7474
Abstract: 7474 for shift register 7474 shift register 7474 texas instruments ABT8245 SN54ABT8245 SN74ABT8245 tms 3534
Text: SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124A - A UGUS T 1992 - REVI SED AUGUS T 1993 ' Members of the Texas Instruments SCOPE Family of Testability Products 1 Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port
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SN54ABT8245,
SN74ABT8245
SCBS124A-AUGUST
SN54/74F245
SN54/74ABT245
GCH74flb
TTL 7474
7474 for shift register
7474 shift register
7474 texas instruments
ABT8245
SN54ABT8245
tms 3534
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SN54ABT8652
Abstract: SN74ABT8652
Text: SN54ABT8652, SN74ABT8652 « SCAN TEST d e v ic e s WITH OCTAL BUS TRANSCEIVERS AND REGISTERS - _ • Members of the Texas Instruments SCOPE Family of Testability Products • Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and
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sn54abt8652,
sn74abt8652
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SN54ABT8652
SN54/74F652
SN54/74ABT652
ci75cu
SN54ABT8652
SN74ABT8652
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