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Catalog Datasheet	MFG & Type	PDF	Document Tags
accretech UF3000 Abstract: UF3000 Text: Agilent E5240C I/CV 3.0 Automaton Software Agilent E5240C I/CV 3.0 Lite Automaton Software Technical Overview Overview Agilent I/CV 3.0 and I/CV 3.0 Lite automation software provide auto mated test solutions for semiconductor characterization. Both versions support semiconductor	Original	PDF	E5240C E5241C E5240CU 5989-1408EN accretech UF3000 UF3000
accretech UF3000 Abstract: UF3000 P12xl accretech P12x UF3000 accretech UG-1214/U Micronics N9201A Text: Agilent N9201A Array Structure Parametric Test Option Technical Overview Introduction The decreasing size of features on integrated circuits 45 nm and smaller is driving the need for new parametric test capabilities. These capabilities must accommodate the advanced test	Original	PDF	N9201A 5989-5747EN accretech UF3000 UF3000 P12xl accretech P12x UF3000 accretech UG-1214/U Micronics N9201A
accretech UF3000 Abstract: No abstract text available Text: Agilent 4082A Parametric Test System Data Sheet General Description Contents General Description 1 Speciﬁcation 3 DC Measurement Subsystem SMU 8 Capacitance Measurement Subsystem 14 Software 17 General Speciﬁcations 18 Recommended Conditions for Ultra-Low Current and Low Voltage	Original	PDF	measu929 5989-6508EN accretech UF3000
UF3000EX Abstract: accretech UF3000 Text: Agilent 4082F Flash Memory Cell Parametric Test System Data Sheet General Description Contents General Description Speciﬁcation Switching matrix subsystem DC measurement subsystem Capacitance measurement subsystem Pulse force unit Software General Speciﬁcations	Original	PDF	4082F 4082F individu929 5989-6548EN UF3000EX accretech UF3000
accretech UF3000 Abstract: 81110A wafer prober P12xl UF3000 c3600 C3750 E4980A E4980 ic 4075 or gate Text: Agilent 4075 Advanced DC/RF/Pulse Parametric Tester Data Sheet General Description Contents General Description 1 Switching Matrix Subsystem 3 Pulse Switch 4 DC Measurement Subsystem 5 Capacitance Measurement Options Agilent E4980A LCR Meter Built-In HSCMU	Original	PDF	E4980A 5989-2730EN accretech UF3000 81110A wafer prober P12xl UF3000 c3600 C3750 E4980 ic 4075 or gate