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    BCT8373A

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


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    PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373 SCBA004C SDYA010 SDYA012 SSYA002C, SZZU001B, SDYU001N, BCT8373A

    ATMEGA32U4

    Abstract: 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 16/32K ATmega16U4/ATmega32U4) 512Bytes/1K Flash/100 7766F ATMEGA32U4 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15

    BCT245

    Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


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    PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT8245A SN54BCT8245A BCT245 F245 SN54BCT8245A SN74BCT8245A

    V5050

    Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


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    PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17customer V5050 BCT244 F244 SN54BCT8244A SN74BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


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    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


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    PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT8245A SN54BCT8245A

    ATMEL 649v

    Abstract: 6490V ATMEGA329 TWI avr adc
    Text: Features • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 16MHz 32KBytes ATmega329/ATmega3290) 64KBytes ATmega649/ATmega6490) 2552K ATMEL 649v 6490V ATMEGA329 TWI avr adc

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


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    PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT245

    ATmega32H

    Abstract: PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2
    Text: Atmel ATmega32HVE2/ATmega64HVE2 8-bit AVR Microcontroller with Precise Analog Frontend for very Accurate Voltage and Current Measurement PRELIMINARY DATASHEET Features ● Single-package fully-integrated ● High precision analog frontend ● 17bit single-ended voltage-ADC


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    PDF ATmega32HVE2/ATmega64HVE2 17bit SAEJ2602-2 ATmega32H PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2

    PFC 5kw

    Abstract: principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81
    Text: Features • High performance, low power Atmel AVR® 8-bit Microcontroller • Advanced RISC architecture • • • • – 131 powerful instructions - most single clock cycle execution – 32 x 8 general purpose working registers – Fully static operation


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    PDF 8/16Kbytes 7734Q PFC 5kw principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81

    bct8240a

    Abstract: No abstract text available
    Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


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    PDF SN54BCT8240A, SN74BCT8240A SCBS067E BCT240 SNJ54BCT8240AFK 5962View 9174601Q3A SNJ54BCT8240AJT 9174601QLA bct8240a

    SS 1091 asn

    Abstract: atmel sine wave pwm circuit atmega 128 atmel atmega 382 SM200 DSAQ00265166. ATMEGA USART programming example ATMEGA 326
    Text: Features • • • • • • • • • • • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller Advanced RISC Architecture – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers


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    PDF 16MIPS 16MHz ATmega165PA/645P) 20MIPS 20MHz /325A/325PA/645A/3250A/3250PA/6450A/6450P 16KBytes ATmega165A/ATmega165PA) 32KBytes 325A/ATmega325PA/ATmega3250A/ATmega3250PA SS 1091 asn atmel sine wave pwm circuit atmega 128 atmel atmega 382 SM200 DSAQ00265166. ATMEGA USART programming example ATMEGA 326

    mega32u4

    Abstract: at90usb164 AT90USB324 Atmega32u4 SP10 SP11 SP12 SP13 SP14 SP15
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF

    Untitled

    Abstract: No abstract text available
    Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid


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    PDF 16-BIT M16C/29 REJ09B0101-0112

    ATMEGA1280-16AU

    Abstract: avr 2560 atmega1280 avr 328 pc 2561 2549K-AVR-01 PJ63 TQFP64 package
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 64K/128K/256K 2549K ATMEGA1280-16AU avr 2560 atmega1280 avr 328 pc 2561 2549K-AVR-01 PJ63 TQFP64 package

    ATMEGA324PA-PU

    Abstract: DRQFN 168T 1610t VATMEGA324PA 25810 oc 192 modulator atmel 1010
    Text: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • – 131 Powerful Instructions – Most Single-clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF

    mega169

    Abstract: atmega169v-8ai
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 2514P mega169 atmega169v-8ai

    atmega169pv-8au

    Abstract: avr adc
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 8018I atmega169pv-8au avr adc

    SN74BCT373

    Abstract: SN74BCT8373 SN74F373
    Text: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and


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    PDF SN74BCT8373 SCBS471 SN74F373 SN74BCT373 SN74BCT8373

    0260F8A

    Abstract: TRANSISTOR BJ 131-6 TRANSISTOR C 2 SUB 131-6 bj 025 48pin RF IC IC 4016 PIN DIAGRAM m16c tiny M30260F8TGP traffic light c language VC0 LQFP48
    Text: REJ09B0202-0200 M16C/26A Group 16 M16C/26A, M16C/26B, M16C/26T Hardware Manual RENESAS 16-BIT SINGLE-CHIP MICROCOMPUTER M16C FAMILY / M16C/Tiny SERIES All information contained in these materials, including products and product specifications, represents information on the product at the time of publication and is subject to change by


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    PDF REJ09B0202-0200 M16C/26A M16C/26A, M16C/26B, M16C/26T) 16-BIT M16C/Tiny M16C/26T 0260F8A TRANSISTOR BJ 131-6 TRANSISTOR C 2 SUB 131-6 bj 025 48pin RF IC IC 4016 PIN DIAGRAM m16c tiny M30260F8TGP traffic light c language VC0 LQFP48

    at90can32-16au

    Abstract: MOB2 module AT90CAN128 AT90CAN32 AT90CAN64 SP12 SP13 SP14 SP15 ni 400 le
    Text: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • • • • • – 133 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers + Peripheral Control Registers


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    PDF 32K/64K/128K AT90CAN32/64/128) at90can32-16au MOB2 module AT90CAN128 AT90CAN32 AT90CAN64 SP12 SP13 SP14 SP15 ni 400 le

    Untitled

    Abstract: No abstract text available
    Text: ACS8515 Rev2.1 LC/P ADVANCED COMMUNICATIONS Line Card Protection Switch for SONET or SDH Network Elements FINAL Description Features The ACS8515 is a highly integrated, single-chip solution for ‘hit-less’ protection switching of SEC clocks from Master and Slave SETS clockcards


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    PDF ACS8515 ISO9001 00/November

    SN54BCT8244A

    Abstract: SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­


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    PDF SN54BCT8244A, SN74BCT8244A SCBS042D SN54/74F244 SN54/74BCT244 752S5 SN54BCT8244A

    74BCT8374

    Abstract: D3641 TEX-E wire
    Text: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW


    OCR Scan
    PDF SN54BCT8374, SN74BCT8374 TI0223-- SN54BCT8374 SN74BCT8374 SN54/74F374 SN54/74BCT374 74BCT8374 D3641 TEX-E wire