BCT8373A
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
SCBA004C
SDYA010
SDYA012
SSYA002C,
SZZU001B,
SDYU001N,
BCT8373A
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ATMEGA32U4
Abstract: 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
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16/32K
ATmega16U4/ATmega32U4)
512Bytes/1K
Flash/100
7766F
ATMEGA32U4
7766D
atmega16 assembly
IC ATMEGA16 power supply schematic
ATmega16 IR remote control
7766E
SP12
SP13
SP14
SP15
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BCT245
Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT8245A
SN54BCT8245A
BCT245
F245
SN54BCT8245A
SN74BCT8245A
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V5050
Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT8244A
SN54BCT8244A
17customer
V5050
BCT244
F244
SN54BCT8244A
SN74BCT8244A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT8245A
SN54BCT8245A
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ATMEL 649v
Abstract: 6490V ATMEGA329 TWI avr adc
Text: Features • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
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16MHz
32KBytes
ATmega329/ATmega3290)
64KBytes
ATmega649/ATmega6490)
2552K
ATMEL 649v
6490V
ATMEGA329 TWI
avr adc
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Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT245
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ATmega32H
Abstract: PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2
Text: Atmel ATmega32HVE2/ATmega64HVE2 8-bit AVR Microcontroller with Precise Analog Frontend for very Accurate Voltage and Current Measurement PRELIMINARY DATASHEET Features ● Single-package fully-integrated ● High precision analog frontend ● 17bit single-ended voltage-ADC
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ATmega32HVE2/ATmega64HVE2
17bit
SAEJ2602-2
ATmega32H
PV15100
PCIE10
atmel 718
ac chopper
ATMEGA64HVE2
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PFC 5kw
Abstract: principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81
Text: Features • High performance, low power Atmel AVR® 8-bit Microcontroller • Advanced RISC architecture • • • • – 131 powerful instructions - most single clock cycle execution – 32 x 8 general purpose working registers – Fully static operation
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8/16Kbytes
7734Q
PFC 5kw
principle block diagram 115v 400hz power
schematic diagram 10kw bldc motor speed controller
1242 qfn32
P320 AVR
AT90PWM81
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bct8240a
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
SNJ54BCT8240AFK
5962View
9174601Q3A
SNJ54BCT8240AJT
9174601QLA
bct8240a
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SS 1091 asn
Abstract: atmel sine wave pwm circuit atmega 128 atmel atmega 382 SM200 DSAQ00265166. ATMEGA USART programming example ATMEGA 326
Text: Features • • • • • • • • • • • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller Advanced RISC Architecture – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers
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16MIPS
16MHz
ATmega165PA/645P)
20MIPS
20MHz
/325A/325PA/645A/3250A/3250PA/6450A/6450P
16KBytes
ATmega165A/ATmega165PA)
32KBytes
325A/ATmega325PA/ATmega3250A/ATmega3250PA
SS 1091 asn
atmel sine wave pwm circuit atmega 128
atmel atmega 382
SM200
DSAQ00265166.
ATMEGA USART programming example
ATMEGA 326
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mega32u4
Abstract: at90usb164 AT90USB324 Atmega32u4 SP10 SP11 SP12 SP13 SP14 SP15
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
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Untitled
Abstract: No abstract text available
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid
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16-BIT
M16C/29
REJ09B0101-0112
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ATMEGA1280-16AU
Abstract: avr 2560 atmega1280 avr 328 pc 2561 2549K-AVR-01 PJ63 TQFP64 package
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
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64K/128K/256K
2549K
ATMEGA1280-16AU
avr 2560
atmega1280
avr 328
pc 2561
2549K-AVR-01
PJ63
TQFP64 package
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ATMEGA324PA-PU
Abstract: DRQFN 168T 1610t VATMEGA324PA 25810 oc 192 modulator atmel 1010
Text: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • – 131 Powerful Instructions – Most Single-clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
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mega169
Abstract: atmega169v-8ai
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
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2514P
mega169
atmega169v-8ai
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atmega169pv-8au
Abstract: avr adc
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
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8018I
atmega169pv-8au
avr adc
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SN74BCT373
Abstract: SN74BCT8373 SN74F373
Text: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and
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SN74BCT8373
SCBS471
SN74F373
SN74BCT373
SN74BCT8373
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0260F8A
Abstract: TRANSISTOR BJ 131-6 TRANSISTOR C 2 SUB 131-6 bj 025 48pin RF IC IC 4016 PIN DIAGRAM m16c tiny M30260F8TGP traffic light c language VC0 LQFP48
Text: REJ09B0202-0200 M16C/26A Group 16 M16C/26A, M16C/26B, M16C/26T Hardware Manual RENESAS 16-BIT SINGLE-CHIP MICROCOMPUTER M16C FAMILY / M16C/Tiny SERIES All information contained in these materials, including products and product specifications, represents information on the product at the time of publication and is subject to change by
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REJ09B0202-0200
M16C/26A
M16C/26A,
M16C/26B,
M16C/26T)
16-BIT
M16C/Tiny
M16C/26T
0260F8A
TRANSISTOR BJ 131-6
TRANSISTOR C 2 SUB
131-6 bj 025
48pin RF IC
IC 4016 PIN DIAGRAM
m16c tiny
M30260F8TGP
traffic light c language
VC0 LQFP48
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at90can32-16au
Abstract: MOB2 module AT90CAN128 AT90CAN32 AT90CAN64 SP12 SP13 SP14 SP15 ni 400 le
Text: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • • • • • – 133 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers + Peripheral Control Registers
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32K/64K/128K
AT90CAN32/64/128)
at90can32-16au
MOB2 module
AT90CAN128
AT90CAN32
AT90CAN64
SP12
SP13
SP14
SP15
ni 400 le
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Untitled
Abstract: No abstract text available
Text: ACS8515 Rev2.1 LC/P ADVANCED COMMUNICATIONS Line Card Protection Switch for SONET or SDH Network Elements FINAL Description Features The ACS8515 is a highly integrated, single-chip solution for ‘hit-less’ protection switching of SEC clocks from Master and Slave SETS clockcards
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ACS8515
ISO9001
00/November
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SN54BCT8244A
Abstract: SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal
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SN54BCT8244A,
SN74BCT8244A
SCBS042D
SN54/74F244
SN54/74BCT244
752S5
SN54BCT8244A
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74BCT8374
Abstract: D3641 TEX-E wire
Text: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW
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SN54BCT8374,
SN74BCT8374
TI0223--
SN54BCT8374
SN74BCT8374
SN54/74F374
SN54/74BCT374
74BCT8374
D3641
TEX-E wire
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