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    CY10E494 Search Results

    CY10E494 Datasheets (10)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    CY10E494-10DC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494-10JC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494-10KC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494-7DC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494-7JC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494-7KC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494L-12DC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494L-12JC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494L-12KC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF
    CY10E494L-12VC Cypress Semiconductor 16,384 x 4 ECL Static RAM Scan PDF

    CY10E494 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    CY27S03A

    Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
    Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability


    Original     		PDF CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide

    CY7C9101

    Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
    Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the


    Original     		PDF

    Untitled

    Abstract: No abstract text available
    Text: CY10E494 CY100E494 CY101E494 CYPRESS SEMICONDUCTOR 16,384x4 ECL Static RAM Features • Capable o f w ithstanding >2001V E SD • 16,384 x 4 bits organization • Open emitter output for ease of memory expansion • Ultra high speed/standard power • Industry-standard pinout


    OCR Scan     		PDF CY10E494 CY100E494 CY101E494 384x4 CY101E494 CY10E494L--12VC 494-10D 10E494--10KMB 10E494--12DM 10E494--12KMB

    K74 PACKAGE DIAGRAM

    Abstract: IR 10e 1h
    Text: = ^~' _ = p r e l im in a r y . ^ SEMICONDUCTOR Features • CY10E494 CY100E494 CY101E494 16,384 x 4 bits organization • Ultra high speed/standard power — tAA = 7 ns — I f E — 180 mA 16,384 x 4 ECL Static RAM • Open emitter output for ease of


    OCR Scan     		PDF 10KH/10K- 100K-compatible CY10E494 CY100E494 CY101E494 CY101E494 10E494-7VC CY10E494-7K 10E494-7DC 10E494-8V K74 PACKAGE DIAGRAM IR 10e 1h

    Untitled

    Abstract: No abstract text available
    Text: r CYPRESS SEMICONDUCTOR Features • Open em itter output for ease of memory expansion • 16,384 x 4 bits organization • Ultra high speed/standard power • — tAA = 7 ns Industry standard pinout Functional Description — IE E = 180 mA • CY1E494 CY10E494


    OCR Scan     		PDF CY1E494 CY10E494 CY100E494 -/10K 100E494 1E494 494-7JC

    1r 10e

    Abstract: N25U
    Text: CY10E494 CY100E494 CY101E494 " 'Y P P F Ç Ç 1 6 ,3 8 4 x 4 ECL Static RAM SEMICONDUCTOR Features • 16,384 x 4 bits organization • Ultra high speed/standard power — tAA = 7 n s — IEK = 180 mA • Low-power version — tAA = 12 ns — I e e = Î35 mA


    OCR Scan     		PDF CY10E494 CY100E494 CY101E494 10KH/10K- 100K-compatible CY101E494 CY10E494-7DC CY10E494-7KC CY10E494-- 1r 10e N25U

    SSC 9101

    Abstract: c494 223A10
    Text: EbE D CYPRESS mg • ssa^bba 0004401 y ■ SEMICONDUCTOR CYPRESS . : PRELIM INARY i - •••••• ^ SEMICONDUCTOR T ^ U S -iO CY1E494 JÇŸÎ5SÎÎ1 CY100E494 ■ ■■ . 16,384 x 4 ECL Static RAM • Open em itter output for ease of memory expansion


    OCR Scan     		PDF CY1E494 CY100E494 10KH/10K CY1E494, CY10E494 CY100E494 00a44fib CY10E494 SSC 9101 c494 223A10

    CY7C2901

    Abstract: No abstract text available
    Text: ÌB Ìcy p ress • Table 10. Die Sizes of Cypress Devices continued P a rt N um ber Size (mil2) P a rt N um ber Size (mil2) ECL Logic CY 2909A 7968 CY100E301L 14875 CY2910A 21750 CY100E302L 14875 CY2911A 7968 CY100E422 6960 11800 CY100E474 10830 CY7C510


    OCR Scan     		PDF CY100E301L CY2910A CY100E302L CY2911A CY100E422 CY100E474 CY7C510 CY100E494 CY7C516 CY10E301L CY7C2901