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    AN1229

    Abstract: "RAM Fault models and Memory Testing" 0X5555 dsPIC33F C-30 CRC16 CRC-16 CRC-32 PIC24F DS01229A
    Text: AN1229 PIC MCU 和 dsPIC® DSC 的 B 类安全软件库 作者： Veena Kudva Microchip Technology Inc. IEC 60730 标准的概述 注： 引言 该应用笔记介绍了 B 类安全软件库程序，该程序用于测 试单通道 CPU 中是否发生故障。这些程序是根据 IEC


    Original     		PDF AN1229 60730-1ed DS01229A AN1229 "RAM Fault models and Memory Testing" 0X5555 dsPIC33F C-30 CRC16 CRC-16 CRC-32 PIC24F

    AN1229

    Abstract: "RAM Fault models and Memory Testing" DS01229A 04C11DB7 0X5555 C-30 CRC16 CRC-16 CRC-32 PIC24F
    Text: AN1229 Class B Safety Software Library for PIC MCUs and dsPIC® DSCs Author: Veena Kudva Microchip Technology Inc. OVERVIEW OF THE IEC 60730 STANDARD Note: INTRODUCTION This application note describes the Class B Safety Software Library routines that detect the occurrence of


    Original     		PDF AN1229 DS01229A-page AN1229 "RAM Fault models and Memory Testing" DS01229A 04C11DB7 0X5555 C-30 CRC16 CRC-16 CRC-32 PIC24F