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    Text: PA200DSP 200 mm Semi-automatic Double-sided Probe System DATA SHEET The PA200DSP is the most precise and lexible semi-automatic double-sided test solution for wafers and substrates up to 200 mm. It is ideal for all applications requiring access from both the front and back sides of the wafer, such as failure analysis with


    Original     		PA200DSP PA200DSP PA200DSP-DS-0412 PDF