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    RELIABILITY TEST DATA Search Results

    RELIABILITY TEST DATA Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
    FO-50LPBMTRJ0-001 Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFPPLOOPBK-003.5 Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation Datasheet

    RELIABILITY TEST DATA Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    106 10k 804

    Abstract: 106F 213B
    Text: CTS ClearONE Terminator Reliability Test Data RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN &


    Original     		PDF

    AVAGO DIP

    Abstract: 0133E MIL-STD-217 FIT
    Text: HCNW138 and HCNW139 Low Input Current, High Gain Optocouplers Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done on this product family. All of these products use


    Original     		HCNW138 HCNW139 MIL-STD-883 1000hrs AV01-0133EN AVAGO DIP 0133E MIL-STD-217 FIT PDF

    d313 TRANSISTOR equivalent

    Abstract: 207a smd ic smd diode 106E mil-std-202F 101D 6822 TRANSISTOR equivalent transistor d323 MIL-STD-202F-201A transistor D313 smd diode 101a D313 VOLTAGE REGULATOR
    Text: RELIABILITY TESTING OF SEMICONDUCTOR DEVICES V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES 1. WHAT IS RELIABILITY TESTING? 2. RELIABILITY TEST METHODS 3. ACCELERATED LIFE TEST 4. ANALYSIS OF TEST RESULTS 4.1 HOW TO USE WEIBULL PROBABILITY PAPER 3. 4.1.1 APPLICATION OF WEIBULL PROBABILITY PAPER


    Original     		R69-20 d313 TRANSISTOR equivalent 207a smd ic smd diode 106E mil-std-202F 101D 6822 TRANSISTOR equivalent transistor d323 MIL-STD-202F-201A transistor D313 smd diode 101a D313 VOLTAGE REGULATOR PDF

    reliability report

    Abstract: quality and reliability report
    Text: Quality and Reliability Report 7. Package Related Reliability Test Data Temperature-Humidity-Bias Test 1. Test Condition Condition: T = 85°C, RH = 85%, Maximum operating voltage Duration: Test time points at 168 hrs, 500 hrs, and 1000 hrs. 2. SRAM Products


    Original     		PDF

    Untitled

    Abstract: No abstract text available
    Text: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and


    Original     		AEC-Q101C PDF

    Untitled

    Abstract: No abstract text available
    Text: Reliability Datasheet Philips Lumileds SnapLED Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SnapLED included extensive operational life-time and


    Original     		AEC-Q101C SnapLED150. PDF

    MIL-STD-217 FIT

    Abstract: No abstract text available
    Text: HCPL-3140 0.4A Photocoupler Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done on this product family. All of these products use the same LEDs, similar IC, and the same packaging


    Original     		HCPL-3140 MIL-STD-883 121oC AV01-0659EN MIL-STD-217 FIT PDF

    Untitled

    Abstract: No abstract text available
    Text: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and


    Original     		AEC-Q101C PDF

    quality and reliability report

    Abstract: No abstract text available
    Text: Quality and Reliability Report 7. Package Related Reliability Test Data Temperature Cycle Test TCT 1. Test Condition Condition: T = -65°C / 15min , +150 °C/15min, Non-bias Duration: 500 cycles 2. DRAM Products Package Type Period Total No of Samples No. of


    Original     		15min C/15min, quality and reliability report PDF

    m63044

    Abstract: m64076 M64026 m7108 M64073 M63062 M64021 M71081 M63006 M71064
    Text: RELIABILITY MONITOR SUMMARY QUARTERLY SUMMARY, QUARTER 1, 1997 April 17, 1997 PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION. CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY STANDARD STRESS TEST DESCRIPTIONS Test HTOL HTOL2


    Original     		CY7C374I-JC M64016 FLASH-FL28D M71081 m63044 m64076 M64026 m7108 M64073 M63062 M64021 M63006 M71064 PDF

    PBGA 256 reflow profile

    Abstract: bt 2328 pbga 144 BGA cte pbga JESD22-A113 OSP FLIPCHIP CRACK 304-pin dimensions bga jedec thermocouple WELD nsmd smd
    Text: Customer Applications Support and Reliability Test Center Page 1 Motorola General Business Information Customer Applications Support and Reliability Test Center Customer support for new and current packaging technology; Package-to-board Interconnect reliability


    Original     		PDF

    MIL-HDBK-217

    Abstract: HCPL 454
    Text: HCPL-4200 Optically Coupled 20 mA Current Loop Receiver Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the past three years on this product family. All of these products use the same LEDs, similar IC,


    Original     		HCPL-4200 specification009 5988-7900EN MIL-HDBK-217 HCPL 454 PDF

    hcpl 731

    Abstract: Optocoupler 601 HCPL 601 MIL-HDBK-217 Optocoupler 721 HCPL-2300 optocoupler avago 601 optocoupler OPTOCOUPLER 436 MIL-STD-217 FIT
    Text: HCPL-2300 8 MBd Low Input Optocoupler Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the qualification of this product family. All of these products use similar IC, and the same packaging materials, processes, stress


    Original     		HCPL-2300 5989-1824EN AV01-0487EN hcpl 731 Optocoupler 601 HCPL 601 MIL-HDBK-217 Optocoupler 721 HCPL-2300 optocoupler avago 601 optocoupler OPTOCOUPLER 436 MIL-STD-217 FIT PDF

    2430 avago

    Abstract: HCPL-2400 HCPL-2430
    Text: HCPL-2400 / 2411, HCPL-2430 20 MBd High CMR Logic Gate Optocouplers Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the past two years on this product family. All of these products use the same


    Original     		HCPL-2400 HCPL-2430 5988-4129EN AV01-0497EN 2430 avago HCPL-2430 PDF

    sharp lt022

    Abstract: LT022 sharp lt024 LT027 LASER LT028 LT025 lt027 Activation Energy LT024 LASER LT023
    Text: Reliability x x x x x x x x x x x x x Reliability Tests Sharp laser diodes are designed to satisfy the following tests. No. 1 2 .— Test _ Solderablllty test – Solder heat resistance test 3 Temperature cycle test 4 Moisture aging test 5 Temperature-humldlty cycle test


    Original     		25-C-+ LT022HC/HS/WD/WS LT023HC/HS/WS LT022 sharp lt022 sharp lt024 LT027 LASER LT028 LT025 lt027 Activation Energy LT024 LASER LT023 PDF

    JEDEC JESD22-B117

    Abstract: JESD22-B117 Solder Paste, Indium 5.8 N41 250 y 803 IPC-9504 10k resistor 1/8 watt datasheet hot air bga Solder Paste, Indium 5.1, Type 3 10k resistor 1/4 watt datasheet
    Text: RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN & REPORT .4


    Original     		PDF

    TRANSISTOR 9642

    Abstract: 9544 transistor T0247 package what is fast IGBT transistor IRG4PC50U Equivalent transistors for IRG4PC50U IRG4BC20FD 600V 16 TO220 IRGPC40U irg4ph50ud IRGB440U
    Text: Quarterly Reliability Report for T0247 / T0220 Products Manufactured at IRGB IGBT / CoPack ISSUE.3. October 1997 IGBT / CoPack Quarterly Reliability Report Page 1 of 35 Contents 1 Introduction 2 Reliability Information 3 Environmental Test Results 4 Environmental Test Conditions / Schematics


    Original     		T0247 T0220 IRG4BC20F IRG4BC20FD IRG4BC30F IRG4BC30FD IRG4BC40F IRG4BC20U IRG4BC20UD IRG4BC30U TRANSISTOR 9642 9544 transistor T0247 package what is fast IGBT transistor IRG4PC50U Equivalent transistors for IRG4PC50U IRG4BC20FD 600V 16 TO220 IRGPC40U irg4ph50ud IRGB440U PDF

    9544 transistor

    Abstract: TRANSISTOR 9642 IRG4PC50U irg4ph50ud igbt failure IRG4PC40UD2 HTGB IRGPH60UD2 IRGBC20FD rectifier IGBT
    Text: Quarterly Reliability Report for T0247 / T0220 Products Manufactured at IRGB IGBT / CoPack ISSUE.3. October 1997 IGBT / CoPack Quarterly Reliability Report Page 1 of 35 Contents 1 Introduction 2 Reliability Information 3 Environmental Test Results 4 Environmental Test Conditions / Schematics


    Original     		T0247 T0220 assIRG4BC20FD IRG4BC30F IRG4BC30FD IRG4BC40F IRG4BC20U IRG4BC20UD IRG4BC30U IRG4BC30UD 9544 transistor TRANSISTOR 9642 IRG4PC50U irg4ph50ud igbt failure IRG4PC40UD2 HTGB IRGPH60UD2 IRGBC20FD rectifier IGBT PDF

    Reliability and Statistics Glossary

    Abstract: reliabil ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES
    Text: Reliability and Statistics Glossary Vishay Semiconductors Reliability and Statistics Glossary DEFINITIONS Bias: Accelerated Life Test: A life test under conditions that are more severe than usual operating conditions. It is helpful, but not necessary, that a relationship between test severity and


    Original     		27-Aug-08 Reliability and Statistics Glossary reliabil ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES PDF

    ECS-3951M/3953M

    Abstract: ECS3953M500 ECS-3951M
    Text: Reliability Test Data Report ECS-3951M/3953M Family of SMD Oscillators Test Completed 6/29/2001 Approved by: Mr. Kurasawa ECS-3951M/3953M Reliability Report ECS-3953M-500 50.000 MHz Oscillator 1.1: Vibration Pre Vibration Stability Hz Stability (ppm) VOH (V)


    Original     		ECS-3951M/3953M ECS-3953M-500 ECS3953M500 ECS-3951M PDF

    13001 s

    Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
    Text: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2


    Original     		1225XL, 1240XL, 1280XL, A1415, A1425, 14100BP, 32140DX, 32200DX 13001 s 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A PDF

    28HC64

    Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
    Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.


    Original     		AT-28HC64 MIL-M-38535 AT-28HC191/291 AT-28PC64 AT-28C256 AT-28HC16/17 AT-28HC64 033474C 234583C1 28HC64 28PC64 28HC16 9C8944 Activation Energy PDF

    Untitled

    Abstract: No abstract text available
    Text: SMD TYPE LED Suntan Reliability Test Items And Conditions The reliability of products shall be satisfied with items listed below. Confidence level : 90% LTPD : 10% Test Items Test Conditions Quantity Judging Criteria 15 Solderable Area Over 95% 11 C=0 & I*


    Original     		PDF

    SOP 8 200MIL

    Abstract: No abstract text available
    Text: TOSHIBA [13] Reliability Data 13. Reliability Data Intrinsic Failure Rate Estimation from Life Test Results 1995/3Q-1996/2Q Data Test Condition :Ta = 125°C, Vcc = 6.0V Operation 1000Hrs. Device 4120 Ta = 60°C Equivalent Device Hours Ea = 0.8V 391.15x106


    OCR Scan     		1995/3Q-1996/2Q 1000Hrs. 15x106 TSSOP-16 TSSOP-20 300cyde 100Hrs. TSSOP-14 SOP 8 200MIL PDF