106 10k 804
Abstract: 106F 213B
Text: CTS ClearONE Terminator Reliability Test Data RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN &
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AVAGO DIP
Abstract: 0133E MIL-STD-217 FIT
Text: HCNW138 and HCNW139 Low Input Current, High Gain Optocouplers Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done on this product family. All of these products use
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HCNW138
HCNW139
MIL-STD-883
1000hrs
AV01-0133EN
AVAGO DIP
0133E
MIL-STD-217 FIT
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d313 TRANSISTOR equivalent
Abstract: 207a smd ic smd diode 106E mil-std-202F 101D 6822 TRANSISTOR equivalent transistor d323 MIL-STD-202F-201A transistor D313 smd diode 101a D313 VOLTAGE REGULATOR
Text: RELIABILITY TESTING OF SEMICONDUCTOR DEVICES V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES 1. WHAT IS RELIABILITY TESTING? 2. RELIABILITY TEST METHODS 3. ACCELERATED LIFE TEST 4. ANALYSIS OF TEST RESULTS 4.1 HOW TO USE WEIBULL PROBABILITY PAPER 3. 4.1.1 APPLICATION OF WEIBULL PROBABILITY PAPER
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R69-20
d313 TRANSISTOR equivalent
207a smd ic
smd diode 106E
mil-std-202F 101D
6822 TRANSISTOR equivalent
transistor d323
MIL-STD-202F-201A
transistor D313
smd diode 101a
D313 VOLTAGE REGULATOR
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reliability report
Abstract: quality and reliability report
Text: Quality and Reliability Report 7. Package Related Reliability Test Data Temperature-Humidity-Bias Test 1. Test Condition Condition: T = 85°C, RH = 85%, Maximum operating voltage Duration: Test time points at 168 hrs, 500 hrs, and 1000 hrs. 2. SRAM Products
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Untitled
Abstract: No abstract text available
Text: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and
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AEC-Q101C
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Untitled
Abstract: No abstract text available
Text: Reliability Datasheet Philips Lumileds SnapLED Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SnapLED included extensive operational life-time and
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AEC-Q101C
SnapLED150.
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MIL-STD-217 FIT
Abstract: No abstract text available
Text: HCPL-3140 0.4A Photocoupler Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done on this product family. All of these products use the same LEDs, similar IC, and the same packaging
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HCPL-3140
MIL-STD-883
121oC
AV01-0659EN
MIL-STD-217 FIT
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Untitled
Abstract: No abstract text available
Text: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and
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AEC-Q101C
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quality and reliability report
Abstract: No abstract text available
Text: Quality and Reliability Report 7. Package Related Reliability Test Data Temperature Cycle Test TCT 1. Test Condition Condition: T = -65°C / 15min , +150 °C/15min, Non-bias Duration: 500 cycles 2. DRAM Products Package Type Period Total No of Samples No. of
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15min
C/15min,
quality and reliability report
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m63044
Abstract: m64076 M64026 m7108 M64073 M63062 M64021 M71081 M63006 M71064
Text: RELIABILITY MONITOR SUMMARY QUARTERLY SUMMARY, QUARTER 1, 1997 April 17, 1997 PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION. CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY STANDARD STRESS TEST DESCRIPTIONS Test HTOL HTOL2
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CY7C374I-JC
M64016
FLASH-FL28D
M71081
m63044
m64076
M64026
m7108
M64073
M63062
M64021
M63006
M71064
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PBGA 256 reflow profile
Abstract: bt 2328 pbga 144 BGA cte pbga JESD22-A113 OSP FLIPCHIP CRACK 304-pin dimensions bga jedec thermocouple WELD nsmd smd
Text: Customer Applications Support and Reliability Test Center Page 1 Motorola General Business Information Customer Applications Support and Reliability Test Center Customer support for new and current packaging technology; Package-to-board Interconnect reliability
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MIL-HDBK-217
Abstract: HCPL 454
Text: HCPL-4200 Optically Coupled 20 mA Current Loop Receiver Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the past three years on this product family. All of these products use the same LEDs, similar IC,
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HCPL-4200
specification009
5988-7900EN
MIL-HDBK-217
HCPL 454
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hcpl 731
Abstract: Optocoupler 601 HCPL 601 MIL-HDBK-217 Optocoupler 721 HCPL-2300 optocoupler avago 601 optocoupler OPTOCOUPLER 436 MIL-STD-217 FIT
Text: HCPL-2300 8 MBd Low Input Optocoupler Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the qualification of this product family. All of these products use similar IC, and the same packaging materials, processes, stress
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HCPL-2300
5989-1824EN
AV01-0487EN
hcpl 731
Optocoupler 601
HCPL 601
MIL-HDBK-217
Optocoupler 721
HCPL-2300
optocoupler avago
601 optocoupler
OPTOCOUPLER 436
MIL-STD-217 FIT
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2430 avago
Abstract: HCPL-2400 HCPL-2430
Text: HCPL-2400 / 2411, HCPL-2430 20 MBd High CMR Logic Gate Optocouplers Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the past two years on this product family. All of these products use the same
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HCPL-2400
HCPL-2430
5988-4129EN
AV01-0497EN
2430 avago
HCPL-2430
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sharp lt022
Abstract: LT022 sharp lt024 LT027 LASER LT028 LT025 lt027 Activation Energy LT024 LASER LT023
Text: Reliability x x x x x x x x x x x x x Reliability Tests Sharp laser diodes are designed to satisfy the following tests. No. 1 2 .— Test _ Solderablllty test – Solder heat resistance test 3 Temperature cycle test 4 Moisture aging test 5 Temperature-humldlty cycle test
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25-C-+
LT022HC/HS/WD/WS
LT023HC/HS/WS
LT022
sharp lt022
sharp lt024
LT027 LASER
LT028
LT025
lt027
Activation Energy
LT024 LASER
LT023
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JEDEC JESD22-B117
Abstract: JESD22-B117 Solder Paste, Indium 5.8 N41 250 y 803 IPC-9504 10k resistor 1/8 watt datasheet hot air bga Solder Paste, Indium 5.1, Type 3 10k resistor 1/4 watt datasheet
Text: RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN & REPORT .4
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TRANSISTOR 9642
Abstract: 9544 transistor T0247 package what is fast IGBT transistor IRG4PC50U Equivalent transistors for IRG4PC50U IRG4BC20FD 600V 16 TO220 IRGPC40U irg4ph50ud IRGB440U
Text: Quarterly Reliability Report for T0247 / T0220 Products Manufactured at IRGB IGBT / CoPack ISSUE.3. October 1997 IGBT / CoPack Quarterly Reliability Report Page 1 of 35 Contents 1 Introduction 2 Reliability Information 3 Environmental Test Results 4 Environmental Test Conditions / Schematics
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T0247
T0220
IRG4BC20F
IRG4BC20FD
IRG4BC30F
IRG4BC30FD
IRG4BC40F
IRG4BC20U
IRG4BC20UD
IRG4BC30U
TRANSISTOR 9642
9544 transistor
T0247 package
what is fast IGBT transistor
IRG4PC50U
Equivalent transistors for IRG4PC50U
IRG4BC20FD 600V 16 TO220
IRGPC40U
irg4ph50ud
IRGB440U
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9544 transistor
Abstract: TRANSISTOR 9642 IRG4PC50U irg4ph50ud igbt failure IRG4PC40UD2 HTGB IRGPH60UD2 IRGBC20FD rectifier IGBT
Text: Quarterly Reliability Report for T0247 / T0220 Products Manufactured at IRGB IGBT / CoPack ISSUE.3. October 1997 IGBT / CoPack Quarterly Reliability Report Page 1 of 35 Contents 1 Introduction 2 Reliability Information 3 Environmental Test Results 4 Environmental Test Conditions / Schematics
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T0247
T0220
assIRG4BC20FD
IRG4BC30F
IRG4BC30FD
IRG4BC40F
IRG4BC20U
IRG4BC20UD
IRG4BC30U
IRG4BC30UD
9544 transistor
TRANSISTOR 9642
IRG4PC50U
irg4ph50ud
igbt failure
IRG4PC40UD2
HTGB
IRGPH60UD2
IRGBC20FD
rectifier IGBT
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Reliability and Statistics Glossary
Abstract: reliabil ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES
Text: Reliability and Statistics Glossary Vishay Semiconductors Reliability and Statistics Glossary DEFINITIONS Bias: Accelerated Life Test: A life test under conditions that are more severe than usual operating conditions. It is helpful, but not necessary, that a relationship between test severity and
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27-Aug-08
Reliability and Statistics Glossary
reliabil
ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES
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ECS-3951M/3953M
Abstract: ECS3953M500 ECS-3951M
Text: Reliability Test Data Report ECS-3951M/3953M Family of SMD Oscillators Test Completed 6/29/2001 Approved by: Mr. Kurasawa ECS-3951M/3953M Reliability Report ECS-3953M-500 50.000 MHz Oscillator 1.1: Vibration Pre Vibration Stability Hz Stability (ppm) VOH (V)
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ECS-3951M/3953M
ECS-3953M-500
ECS3953M500
ECS-3951M
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SOP 8 200MIL
Abstract: No abstract text available
Text: TOSHIBA [13] Reliability Data 13. Reliability Data Intrinsic Failure Rate Estimation from Life Test Results 1995/3Q-1996/2Q Data Test Condition :Ta = 125°C, Vcc = 6.0V Operation 1000Hrs. Device 4120 Ta = 60°C Equivalent Device Hours Ea = 0.8V 391.15x106
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1995/3Q-1996/2Q
1000Hrs.
15x106
TSSOP-16
TSSOP-20
300cyde
100Hrs.
TSSOP-14
SOP 8 200MIL
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13001 s
Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
Text: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2
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1225XL,
1240XL,
1280XL,
A1415,
A1425,
14100BP,
32140DX,
32200DX
13001 s
13001 datasheet
13001
JL-01
ACTEL 1020B
RTSX32
B 13001
RTSX16
42MX09
1280A
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28HC64
Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.
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AT-28HC64
MIL-M-38535
AT-28HC191/291
AT-28PC64
AT-28C256
AT-28HC16/17
AT-28HC64
033474C
234583C1
28HC64
28PC64
28HC16
9C8944
Activation Energy
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Untitled
Abstract: No abstract text available
Text: SMD TYPE LED Suntan Reliability Test Items And Conditions The reliability of products shall be satisfied with items listed below. Confidence level : 90% LTPD : 10% Test Items Test Conditions Quantity Judging Criteria 15 Solderable Area Over 95% 11 C=0 & I*
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