Untitled
Abstract: No abstract text available
Text: SN74LVC00AĆEP QUADRUPLE 2ĆINPUT POSITIVEĆNAND GATE SCAS729 − NOVEMBER 2003 D Controlled Baseline D D D D D D D D D − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing
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Original
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SN74LVC00AEP
SCAS729
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729A – NOVEMBER 2003 – REVISED JUNE 2005 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
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Original
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SN74LVC00A-EP
SCAS729A
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729A – NOVEMBER 2003 – REVISED JUNE 2005 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
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Original
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SN74LVC00A-EP
SCAS729A
MIL-STD-883,
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PDF
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Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729B – NOVEMBER 2003 – REVISED MARCH 2007 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
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Original
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SN74LVC00A-EP
SCAS729B
MIL-STD-883,
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