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    Untitled

    Abstract: No abstract text available
    Text: High-Rellability High-Speed CMOS Logic ICs CD54HC393/3A CD54HCT393/3A 37 E D Ha r r i s 4302271 semicond DDSST? 3 MHAS sector ''P 4 5 -2 .W 3 T - S M °l Switching Sp66d Lim its w ith black dots (. are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t r, t, = 6


    OCR Scan     		PDF CD54HC393/3A CD54HCT393/3A Sp66d 54HCT 54HC/HCT 2k-47k

    CD4059B

    Abstract: No abstract text available
    Text: 4302571 0Q5b02fl 3 * 37 E IHAS HIgh-Rellability High-Speed CMOS Logic ICs HARRIS SEMICON» SECTOR CD54HC4053/3A CD54HCT4053/3A T -5 1 -1 2 Switching Sp66d Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (Ct. = 50 pF, Input t„ t, = 6 ns)


    OCR Scan     		PDF 0Q5b02fl CD54HC4053/3A CD54HCT4053/3A Sp66d CD54HC/HCT4053 CD54HC/HC HCT4060 HC4060; 14-STAGE CD4059B

    54HC

    Abstract: CD54HC221 CD54HCT221 hct195
    Text: High-Reliability High-Speed C M O S Logic ICs CD54HC195/3A CD54HCT195/3 A Switching Sp66d L im its w ith b la ck dots (• are tested 100%.) SWITCHING CHARACTERISTICS (C L = 50 pF, Input t„ t, = 6 ns) LIMITS TEST 25 >C 55 C to +125°C CONDITIONS S4HCT


    OCR Scan     		PDF CD54HC195/3A CD54HCT195/3 54HCT CD54HC/HCT221 CD54HC/HCT221 2k-47k 54HC CD54HC221 CD54HCT221 hct195

    Untitled

    Abstract: No abstract text available
    Text: ÛUALITY SEM IC ON DU CT OR INC 41E D Q S7201, Q • ?4bEifiG3 OGQQMbl S M û S I QS7202 High Sp66d CMOS 9-bit FIFO Buffer Memories 512x9: 1Kx9: QS7201 QS7202 FEATURES/BENEFITS •15ns flag and data access times • Fully Asynchronous Read and Write I • Zero fall-through time


    OCR Scan     		PDF S7201, QS7202 Sp66d 512x9: QS7201 MIL-STD-883, mil/600 QS7201

    SM5829P

    Abstract: ISZ50
    Text: n I Q / " n ip p o n p r e c is io n c ir c u it s l t d . SM5829P Hic|h-sp66d, 8 _bit Vsrisbls-lGnQth Shift RGQistGr O VER VIEW PINOUT The S M 5829P is a variable-length shift register fabricated in M olybdenum -gate CMOS. The length can be set to any value between 2 and 129.


    OCR Scan     		PDF SM5829P SM5829P 129-step NC9108AE ISZ50

    CT158

    Abstract: CT-160
    Text: High-Reliability High-Speed C M O S Logic ICs CD54HC158/3A CD54HCT158/3A Switching Sp66d L im its w itn bla ck d o ts (• are tested 100%.) S W IT C H IN G C H A R A C T E R IS T IC S <CL = 50 pF, Input t„ t, = 6 ns) L IM IT S TEST C O N D IT IO N S C H A R A C T E R IS T IC


    OCR Scan     		PDF CD54HC158/3A CD54HCT158/3A 54HCT CT158 CT-160

    pzgl

    Abstract: TTL ALU 54HC
    Text: .High-Reliability High-Speed C M O S Logic ICs CD54HC182/3A CD54HCT182/3A Carry Generator T h e R CA C D 54H C 182 and C D 5 4 H C T 1 8 2 c a rry lookahead g e n e ra to rs are h ig h -sp e e d s ilic o n -g a te C M O S devices and are pin co m p a tib le w ith lo w -p o w e r S c h o ttk y T T L LS TTL .


    OCR Scan     		PDF CD54HC182/3A CD54HCT182/3A CD54HC182 CD54HCT182 CD54HC/HCT182 HC/HCT182 CD54HC/HCT182 2k-47k pzgl TTL ALU 54HC

    CD4059B

    Abstract: No abstract text available
    Text: 37E D WÊ 430 2 27 1 002b02b T • HAS - High-Reliability High-Speed CMOS Logic ICs HARRIS S E M I C O N D SE CT OR CD54HC4052/3A CD54HCT4052/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t„ t, = 6 ns)


    OCR Scan     		PDF 002b02b CD54HC4052/3A CD54HCT4052/3A 54HCT CD4059B